Last update : 01.13.2026
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Lalmi, B., Girardeaux, C., Portavoce, A., Ottaviani, C., Aufray, B., Bernardini, J. "Formation and stability of a two-dimensional nickel silicide on Ni(111): An Auger, LEED, STM, and high-resolution photoemission study" Physical Review B., 85(24): art.n° 245306. (2012).
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Moubah, R., Elzo, M., El Moussaoui, S., Colson, D., Jaouen, N., Belkhou, R., Viret, M. "Direct imaging of both ferroelectric and antiferromagnetic domains in multiferroic BiFeO3 single crystal using x-ray photoemission electron microscopy" Applied Physics Letters., 100(4): art.n° 042406. (2012).
Hongping, Y., Cheng, W., Garcia, A., Swaraj, S., Gu, Z., McNeill, C.R., Schuettfort, T., Sohn, K.E., Kramer, E.J., Bazan, G.C., Nguyen, T.Q., Ade, H. "Interfaces in organic devices studied with resonant soft x-ray reflectivity" Journal of Applied Physics., 110(10): art.n° 102220. (2011).
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