PUBLICATIONS

Last update : 25/07/2026
  • Lablanquie, P., Penent, F., Palaudoux, J., Andric, L., Selles, P., Carniato, S., Bucar, K., Žitnik, M., Huttula, M., Eland, J.H.D., Shigemasa, E., Soejima, K., Hikosaka, Y., Suzuki, I. H., Nakano, M., Ito, K. "Properties of Hollow Molecules Probed by Single-Photon Double Ionization" Physical Review Letters., 106(6): art.n° 063003. (2011).
  • Vogel, J., Bonfim, M., Rougemaille, N., Boulle, O., Miron, I.M., Auffret, S., Rodmacq, B., Gaudin, G., Cezar, J.C., Sirotti, F., Pizzini, S. "Direct Observation of Massless DomainWall Dynamics in Nanostripes with Perpendicular Magnetic Anisotropy" Physical Review Letters., 108(24): art.n° 247202. (2012).
  • Yukawa, R., Yamamoto, S., Ozawa, K., D’Angelo, M., Ogawa, M., Silly, M.G., Sirotti, F., Matsuda, I. "Electronic structure of the hydrogen-adsorbed SrTiO3(001) surface studied by polarization-dependent photoemission spectroscopy" Physical Review B., 87(11): art.n° 115314. (2013).
  • Pierucci, D., Sediri, H., Hajlaoui, M., Girard, J.C., Brumme, T., Calandra, M., Velez-Fort, E., Patriarche, G., Silly, M.G., Ferro, G., Souliere, V., Marangolo, M., Sirotti, F., Mauri, F., Ouerghi, A. "Evidence for Flat bands near Fermi Level in Epitaxial Rhombohedral Multilayer Graphene" ACS Nano., 9(5): 5432-5439. (2015).
  • Mathieu, C., Bai, X, Bournel, F., Gallet, J.J., Carniato, S., Rochet, F., Sirotti, F., Silly, M.G., Chauvet, C., Krizmancic, D., Hennies, F. "Nitrogen 1s NEXAFS and XPS spectroscopy of NH3-saturated Si(001)-2×1: Theoretical predictions and experimental observations at 300 K" Physical Review B., 79(20): art.n° 205317. (2009).
  • Bendounan, A., Braun, J., Minár, J., Bornemann, S., Fasel, R., Gröning, O., Fagot-Revurat, Y., Kierren, B., Malterre, D., Sirotti, F., Ebert, H. "Monitoring the formation of interface-confined mixture by photoelectron spectroscopy" Physical Review B., 85(24): art.n° 245403. (2012).
  • Lavayssière, M., Escher, M., Renault, O., Mariolle, D., Barrett, N. "Electrical and physical topography in energy-filtered photoelectron emission microscopy of two-dimensional silicon pn junctions" Journal of Electron Spectroscopy and Related Phenomena., 186: 30-38. (2013).
  • Pallecchi, E., Lafont, F., Cavaliere, V., Schopfer, F., Mailly, D., Poirier, W., Ouerghi, A. "High Electron Mobility in Epitaxial Graphene on 4H-SiC(0001) via post-growth annealing under hydrogen" Scientific Reports., 4: art.n° 4558. (2014).
  • Bendounan, A., Aït-Ouazzou, S. "Role of the Shockley State in Doping of Organic Molecule Monolayer" Journal of Physical Chemistry C., 120(21): 11456–11464. (2016).
  • Baudot, S., Leroux, C., Chave, F., Boujamaa, R., Martinez, E., Caubet, P., Silly, M.G., Sirotti, F., Reimbold, G., Ghibaudo, G. "Understanding reversal effects of metallic aluminum introduced in HfSiON/TiN PMOSFETs" Microelectronic Engineering., 88(7): 1305-1308. (2011).