PUBLICATIONS

Last update : 10/10/2026
  • Emprin, B., Troussel, P., Soullie, G., Stemmler, P., Mercere, P., Meltchakov, E., Jerome, A., Delmotte, F. "X-ray broadband Ni/SiC multilayers: improvement with W barrier layers" Optics Express., 22(21): 25853-25865. (2014).
  • Polack, F., Lagarde, B., Idir, M., Liard, A., Jourdain, E., Roulliay, M., Delmotte, A., Gautier, J., Ravet-Krill, M. F., Jae-Young Choi & Seungyu Rah "Alternate Multilayer Gratings with Enhanced Diffraction Efficiency in the 500-5000 eV Energy Domain" Paper presented at the Ninth International Conference on Synchrotron Radiation Instrumentation 28 May-2 June 2006. Jae-Young Choi & Seungyu Rah, 879: 489-492. (2006).
  • Medjoubi, K., Thompson, A., Bérar, J.F., Clemens, J.C., Delpierre, P., Da Silva, P., Dinkespiler, B., Fourme, R., Gourhant, P., Guimaraes, B.G., Hustache, S., Idir, M., Itié, J.P., Legrand, P., Menneglier, C., Mercere, P., Picca, F., Samama, J.P., "Energy resolution of the CdTe-XPAD detector: calibration and potential for Laue diffraction measurements on protein crystals" Journal of Synchrotron Radiation., 19(3): 323-331. (2012).
  • Lubeck, J., Bogovac, M., Boyer, B., Detlefs, B., Eichert, D., Fliegauf, R., Grötzsch, D., Holfelder, I., Hönicke, P., Jark, W., Kaiser, R.B., Kanngießer, B., Karydas, A.G., J. J. Leani, J.J., Lépy, M.C., Lühl, L., Ménesguen, Y., Migliori, A., Müller, M., Pollakowski, B., Spanier, M., Sghaier, H., Ulm, G., Weser, J., Beckhoff, B. "A new generation of x-ray spectrometry UHV instruments at the SR facilities BESSY II, ELETTRA and SOLEIL" AIP Conference Proceedings., 1741: art.n° 030011. (2016).
  • Nadji, A., Chubar, O., Idir, M., Level, M.P., Loulergue, A., Moreno, T., Nadolski, L.S., Polack, F., "Femto-second Electron Beam Slicing Project at SOLEIL" Paper presented at the European Particle Accelerator Conf. 9th, 5-9 July 2004. 2332-2334. (2004).
  • Modi, M.H., Mercère, P., Idir, M. "High precision surface metrology using a phase retrieval method" Journal of Physics Conferences Series., 186: art.n° 012068. (2009).
  • Mohacsi, I., Karvinen, P., Vartiainen, I., Diaz, A., Somogyi, A., Kewish, C.M., Mercere, P., David, C., Barry Lai "High efficiency x-ray nanofocusing by the blazed stacking of binary zone plates" Paper presented at the X-Ray Nanoimaging: Instruments and Methods, San Diego (US), August 25, 2013. Barry Lai, 8851: art.n° 88510Z. (2013).
  • Idir, M., Mercère, P., Moreno, T., Delmotte, A. "Metrology and test beamline at SOLEIL" Synchrotron Radiation News., 19(4): 18-23. (2006).
  • Reverchon, J.L., Bansropun, S., Truffer, J.P., Costard, E., Frayssinet, E., Brault, J., Duboz, J.Y., Giuliani, A., Idir, M. "Performances of AlGaN-based focal plane arrays from 10nm to 200nm" Paper presented at the Space Missions and Technologies, 5 April 2010, Orlando, Florida, USA. 7691: art.n° 769109. (2010).
  • Emprin, B., Troussel, P., Soullié, G., Stemmler, P., Mercère, P., Meltchakov, E., Jérôme, A., Delmotte, F. "Characterization of subnanometric layers by grazing incidence X-ray reflectometry" Thin Solid Films., 556: 54–60. (2014).