PUBLICATIONS

Last update : 09/03/2026
  • Idir, M., Mercère, P., Moreno, T., Delmotte, A., Jae-Young Choi & Seungyu Rah "Metrology and Tests Beamline at SOLEIL" Paper presented at the Ninth International Conference on Synchrotron Radiation Instrumentation 28 May-2 June 2006. Jae-Young Choi & Seungyu Rah, 879: 619-622. (2006).
  • Thomasset, M., Moreno, T., Capitanio, B., Idir, M., Bucourt, S. "In-situ metrology for the optimization of bent crystals used in hard-X-ray monochromators: Comparison between measurement and simulation" Nuclear Instruments and Methods A., 616(2-3): 197-202. (2010).
  • Mercère, P. "Métrologie à SOLEIL : optique en rayons X" Photoniques., 72: 39-41. (2014).
  • Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Polack, F., Idir, M., Mercère, P., Brochet, S., Moreno, T., Wolfgang Osten, Christophe Gorecki, Erik L. Novak "Surface metrology with a stitching Shack-Hartmann profilometric head" Paper presented at the Optical Measurement Systems for Industrial Inspection V, Munich, Germany, 18 June 2007. Wolfgang Osten, Christophe Gorecki, Erik L. Novak, 6616: 66162A. (2007).
  • Reverdin, C., Thais, F., Loisel, G., Busquet, M., Bastiani-Ceccotti, S., Blenski, T., Caillaud, T., Ducret, J.E., Foelsner, W., Gilles, D., Gilleron, F., Pain, J.C., Poirier, M., Serres, F., Silvert, V., Soullie, G., Turck-Chieze, S., Villette, B. "X-ray grating spectrometer for opacity measurements in the 50 eV to 250 eV spectral range at the LULI 2000 laser facility" Review of Scientific Instruments., 83(10): art.n° 10E134. (2012).
  • Ménesguen, Y., Gerlach, M., Pollakowski, B., Unterumsberger, R., Haschke, M., Beckhoff, B., Lépy, M.C. "High accuracy experimental determination of copper and zinc mass attenuation coefficients in the 100 eV to 30 keV photon energy range" Metrologia., 53(1): art.n° 7. (2016).
  • Farys, V., Schiavone, P., Polack, F., Idir, M., Bertolo, M., Bianco, A., La-Rosa, S., Cautero, G., Vannuffel, C., Quesnel, E., Muffato, V. "Highly sensitive detection technique of buried defects in extreme ultraviolet masks using at-wavelength scanning dark-field microscopy" Applied Physics Letters., 87(2): art.n° 024102. (2005).
  • Nagler, B., Zastrau, U., Fäustlin, R.R., Vinko, S.M., Whitcher, T., Nelson, A.J., Sobierajski, R., Krzywinski, J., Chalupsky, J., Abreu, E., Bajt, S., Bornath, T., Burian, T., Chapman, H., Cihelka, J., Döppner, T., Düsterer, S., Dzelzainis, T., Fajardo, M., Förster, E., Fortmann, C., Galtier, E., Glenzer, S.H., Göde, S., Gregori, G., Hajkova, V., Heimann, P., Juha, L., Jurek, M., Khattak, F.Y., Khorsand, A.R., Dorota Klinger, D., Kozlova, M., Laarmann, T., Lee, H.J., Lee, R.W., Meiwes-Broer, K.H., Mercère, P., Murphy, W.J., Przystawik, A., Redmer, R., Reinholz, H., Riley, D., Röpke, G., Rosmej, F., Saksl, K., Schott, R., Thiele, R., Tiggesbäumker, J., Toleikis, S., Tschentscher, T., Uschmann, I., Vollmer, H.J., Wark, J.S. "Turning solid aluminium transparent by intense soft X-ray photoionization" Nature Physics., 5(9): 693-696. (2009).
  • Potier, J., Mercere, P., Da Silva, J., Idir, M. "Experimental comparison of full and partial coherent illumination in coherent diffraction imaging reconstructions" Journal of Physics Conferences Series., 425: art.n° 192009. (2013).
  • Itié, J.P., Flank, A.M., Lagarde, P., Polian, A., Couzinet, B., Idir, M., Jae-Young Choi & Seungyu Rah "Extension to Low Energies (<7keV) of High Pressure X-Ray Absorption Spectroscopy" Paper presented at the Ninth International Conference on Synchrotron Radiation Instrumentation 28 May-2 June 2006. Jae-Young Choi & Seungyu Rah, 879: 1329-1332. (2006).