PUBLICATIONS

Last update : 24/06/2026
  • Ménesguen, Y., Boyer, B., Rotella, H., Lubeck, J., Weser, J., Beckhoff, B., Grötzsch, D., Kanngießer, B., Novikova, A., Nolot, E., Lépy, M.C. "CASTOR, a new instrument for combined XRR-GIXRF analysis at SOLEIL" X-ray Spectrometry., 46(5): 303–308. (2017).
  • Do, A., Troussel, P., Baton, S.D., Dervieux, V., Gontier, D., Lechebourg, L., Loupias, B., Obst, L., Pérez, F., Renaudin, P., Reverdin, C., Rubbelynck, C., Stemmler, P., Soullié, G. "High-resolution quasi-monochromatic X-ray imaging using a Fresnel phase zone plate and a multilayer mirror" Review of Scientific Instruments., 88(1): art.n° 013701. (2017).
  • Kaščáková, S., Giuliani, A., Lacerda, S., Pallier, A., Mercère, P., Tóth, E., Réfrégiers, M. "X-Ray induced RadioPhotoDynamic Therapy (RPDT) using lanthanide micelles: beyond depth limitations" Nano Research., 8(7): 2373-2379. (2015).
  • Idir, M., Mercère, P., Moreno, T., Delmotte, A. "Metrology and test beamline at SOLEIL" Synchrotron Radiation News., 19(4): 18-23. (2006).
  • Reverchon, J.L., Bansropun, S., Truffer, J.P., Costard, E., Frayssinet, E., Brault, J., Duboz, J.Y., Giuliani, A., Idir, M. "Performances of AlGaN-based focal plane arrays from 10nm to 200nm" Paper presented at the Space Missions and Technologies, 5 April 2010, Orlando, Florida, USA. 7691: art.n° 769109. (2010).
  • Emprin, B., Troussel, P., Soullié, G., Stemmler, P., Mercère, P., Meltchakov, E., Jérôme, A., Delmotte, F. "Characterization of subnanometric layers by grazing incidence X-ray reflectometry" Thin Solid Films., 556: 54–60. (2014).
  • Thomasset, M., Brochet, S., Idir, M., Moreno, T., Polack, F., Carré, J.F., AIP "Metrology results on multielectrod bimorph mirrors" Paper presented at the Third International Workshop on Metrology for X-ray Optics- SRI 2006. AIP, Abstract n° 34050015. (2006).
  • Primot, J., Rizzi, J., Mercère, P., Idir, M., Bon, P., Wattellier, B., Druart, G., Vincent, G., Haïdar, R., Weitkamp, T., Guérineau, N., Monneret, S., Atsushi Momose, Wataru Yashiro "Multi-lateral shearing interferometry: Principle and application to X-ray phase imaging" Paper presented at the International Workshop on X-ray and Neutron Phase Imaging with Gratings. Atsushi Momose, Wataru Yashiro, 1466: 35-40. (2012).
  • Ménesguen, Y., Boyer, B., Rodrigues, M., Lépy, M.C. "Measurement of partial L fluorescence yields of bismuth using synchrotron radiation" Applied Radiation and Isotopes., 109: 133-138. (2016).
  • Belin, S., Briois, V., Traverse, A., Idir, M., Moreno, T., Ribbens, M. "SAMBA a new beamline at SOLEIL for x-ray absorption spectroscopy in the 4-40 keV energy range" Physica Scripta T., 115: 980-983. (2005).