PUBLICATIONS

Last update : 24/06/2026
  • Meuris, A., Schneider, B., Allaire, H., Baudin, D., Cojocari, I., Da Silva, P., Doumayrou, E., Götz, D., Ferrando, P., Laurent, P., Lortholary, M., Mercère, P., Pinsard, F., Prieur, M., Pichon, T., Provost, L., Renaud, D., Renault-Tinacci, N., Tollet, T., Visticot, F. "Characterization of the focal plane of the microchannel X-ray telescope at the metrology beamline of SOLEIL synchrotron for the space astronomy mission SVOM" Nuclear Instruments and Methods A., 1048: art.n° 167909. (2023).
  • Elvira, V.H., Lépy, M.C., Ménesguen, Y. "Primary calibration of photodiodes with monochromatic X-ray beams using an electrical-substitution radiometer" X-ray Spectrometry., 52(6): 279-289. (2023).
  • Mahmoud, A.H.K., de Rossi, S., Meltchakov, E., Capitanio, B., Thomasset, M., Vallet, M., Héripré, E., Delmotte, F. "Al/Mo/SiC multilayer diffraction gratings with broadband efficiency in the extreme ultraviolet" Optics Express., 30(21): 38319-38338. (2022).
  • Ménesguen, Y., Lépy, M.C., Ito, Y., Yamashita, M., Fukushima, S., Tochio, T., Polasik, M., Słabkowska,K., Syrocki,L., Indelicato, P., Gomilsek, J.P., Marques, J.P., Sampaio, J.M., Machado,J., Amaro,P., Guerra,M., Santos,J.P., Parente, F. "Structure of single KL0–, double KL1–, and triple KL2 − ionization in Mg, Al, and Si targets induced by photons, and their absorption spectra" Radiation Physics and Chemistry., 194: art.n° 110048. (2022).
  • Ménesguen, Y., Lépy, M.C. "Reference-Free Combined X-Ray Reflectometry−Grazing Incidence X-Ray Fluorescence at the French Synchrotron SOLEIL" Physica status Solidi A., 219(9): art.n° 2100423. (2022).
  • Huart, L., Nicolas, C., Hervé du Penhoat, M.A., Guigner, J.M., Gosse, C., Palaudoux, J., Lefrançois, S., Mercere, P., Dasilva, P., Renault, J.P., Chevallard, C. "A microfluidic dosimetry cell to irradiate solutions with poorly penetrating radiations: a step towards online dosimetry for synchrotron beamlines" Journal of Synchrotron Radiation., 28(3): 778-789. (2021).
  • Ménesguen, Y., Lépy, M.C. "Metrology of thin layer deposition with combined XRR-GIXRF analysis at SOLEIL". Proceedings of SPIE., 11611: art.n° 116110I. (2021).
  • Nakaye, Y., Sakumura, T., Sakuma, Y., Mikusu, S., Dawiec, A., Orsini, F., Grybos, P., Szczygiel, R., Maj, P., Ferrara, J.D., Taguchi, T. "Characterization and performance evaluation of the XSPA‐500k detector using synchrotron radiation" Journal of Synchrotron Radiation., 28(2): 439-447. (2021).
  • de La Rochefoucauld, O., Dovillaire, G., Harms, F., Idir, M., Huang, L., Levecq, X., Piponnier, M., Zeitoun, P. "EUV and Hard X-ray Hartmann Wavefront Sensing for Optical Metrology, Alignment and Phase Imaging" Sensors., 21(3): art.n° 874. (2021).
  • Beckhoff, B. "SI traceable characterisation of nanomaterials by X-ray spectrometry" IOP Conf. Series: Materials Science and Engineering., 891: art.n° 012003. (2020).