PUBLICATIONS
- Mercère, P., Idir, M., Moreno, T., Cauchon, G., Dovillaire, G., Levecq, X., Bucourt, S., Jae-Young Choi & Seungyu Rah "Wavefront Closed-Loop Correction for X-Ray Microfocusing Active Optics" Paper presented at the Ninth International Conference on Synchrotron Radiation Instrumentation 28 May-2 June 2006. Jae-Young Choi & Seungyu Rah, 879: 722-725. (2006).
- Ménesguen,, Lépy, M.C. "Characterization of the Metrology beamline at the SOLEIL synchrotron and application to the determination of mass attenuation coefficients of Ag and Sn in the range 3.5<E<28keV" X-Ray Spectrometry., 40(6): 411-416. (2011).
- Trosseille, C., Aubert, D., Auger, L., Bazzoli, S., Beck, T., Brunel, P., Burillo, M., Chollet, C., Gazave, J., Jasmin, S., Maruenda, P., Moreau, I., Oudot, G., Raimbourg, J., Soullié, G., Stemmler, P., Zuber, C. "Overview of the ARGOS X-ray framing camera for Laser MegaJoule" Review of Scientific Instruments., 85(11): art.n° 11D620 . (2014).
- Gautier, J., Zeitoun, P., Hauri, C., Morlens, A.S., Rey, G., Valentin, C., Papalarazou, E., Goddet, J.P., Sebban, S., Burgy, F., Mercère, P., Idir, M., Dovillaire, G., Levecq, X., Bucourt, S., Fajardo, M., Merdji, H., Caumes, J.P. "Optimization of the wave front of high order harmonics" European Physical Journal D., 48(3): 459-463. (2008).
- Idir, M., Dovillaire, G., Mercere, P. "Ex- and In-situ Metrology Based on the Shack-Hartmann Technique for Sub-nanometric Metrology" Synchrotron Radiation News., 26(5): 23-29. (2013).
- Desjardins, K., Hustache, S., Polack, F., Moreno, T., Idir, M., Dubuisson, J.M., Daguerre, J.P., Giorgetta, J.L., Thoraud, S., Delmotte, F., Ravet-Krill, M. F., Jae-Young Choi & Seungyu Rah, "The DiagOn : an Undulator Diagnostic for SOLEIL Low Energy Beamlines" Paper presented at the Ninth International Conference on Synchrotron Radiation Instrumentation 28 May-2 June 2006. Jae-Young Choi & Seungyu Rah, 879: 1101-1104. (2006).
- Idir, M., Mercère, P., Modi, M.H., Dovillaire, G., Levecq, X., Bucourt, S., Escolano, L., Sauvageot, P. "X-ray active mirror coupled with a Hartmann Wavefront Sensor" Nuclear Instruments and Methods A., 616(2-3): 162-171. (2010).
- Buton, C., Dawiec, A., Graber-Bolis, J., Arnaud, K., Bérar, J.F., Blanc, N., Boudet, N., Clémens, J.C., Debarbieux, F., Delpierre, P., Dinkespiler, B., Gastaldi, T., Hustache, S., Pangaud, P., Perez-Ponce, H., Vigeolas, E. "Comparison of three types of XPAD3.2/CdTe single chip hybrids for hard X-ray applications in material science and biomedical imaging" NIM A., 758: 44–56. (2014).
- Mercère, P., Idir, M., Moreno, T., Cauchon, G., Dovillaire, G., Levecq, X., Couvet, L., Bucourt, S., Zeitoun, P. "Automatic alignment of a Kirkpatrick-Baez active optic by use of a soft X-ray Hartmann wave-front sensor" Optics Letters., 31(2): 199-201. (2006).
- Modi, M.H., Lodha, G.S., Thomasset, M., Idir, M., Alka B. Garg, R. Mittal, R. Mukhopadhyay "Study of Micro Roughness Parameters and Growth Characteristics of NbC/Si Multilayer using Layer by Layer Power Spectral Density Analysis" Paper presented at the SOLID STATE PHYSICS, PROCEEDINGS OF THE 55TH DAE SOLID STATE PHYSICS SYMPOSIUM 2010 - Manipal, (India), 26–30 December 2010. Alka B. Garg, R. Mittal, R. Mukhopadhyay, 1349: 715-716. (2011).