PUBLICATIONS

Last update : 09/03/2026
  • Emprin, B., Troussel, P., Soullié, G., Stemmler, P., Mercère, P., Meltchakov, E., Jérôme, A., Delmotte, F. "Characterization of subnanometric layers by grazing incidence X-ray reflectometry" Thin Solid Films., 556: 54–60. (2014).
  • Thomasset, M., Brochet, S., Idir, M., Moreno, T., Polack, F., Carré, J.F., AIP "Metrology results on multielectrod bimorph mirrors" Paper presented at the Third International Workshop on Metrology for X-ray Optics- SRI 2006. AIP, Abstract n° 34050015. (2006).
  • Primot, J., Rizzi, J., Mercère, P., Idir, M., Bon, P., Wattellier, B., Druart, G., Vincent, G., Haïdar, R., Weitkamp, T., Guérineau, N., Monneret, S., Atsushi Momose, Wataru Yashiro "Multi-lateral shearing interferometry: Principle and application to X-ray phase imaging" Paper presented at the International Workshop on X-ray and Neutron Phase Imaging with Gratings. Atsushi Momose, Wataru Yashiro, 1466: 35-40. (2012).
  • Ménesguen, Y., Boyer, B., Rodrigues, M., Lépy, M.C. "Measurement of partial L fluorescence yields of bismuth using synchrotron radiation" Applied Radiation and Isotopes., 109: 133-138. (2016).
  • Belin, S., Briois, V., Traverse, A., Idir, M., Moreno, T., Ribbens, M. "SAMBA a new beamline at SOLEIL for x-ray absorption spectroscopy in the 4-40 keV energy range" Physica Scripta T., 115: 980-983. (2005).
  • Modi, M.H., Rai, S.K., Thomasset, M., Lodha, G.S., Idir, M. "Effect of surface roughness on multilayer film growth" European Physical Journal.-Special Topics., 167(1): 27-32. (2009).
  • Paoloni, C., Di Carlo, A., Bouamrane, F., Bouvet, T., Durand, A.J., Kotiranta, M., Krozer, V., Megtert, S., Mineo, M., Zhurbenko, V. "Design and Realization Aspects of 1-THz Cascade Backward Wave Amplifier Based on Double Corrugated Waveguide" IEEE Transactions on Electron Devices., 60(3): 1236-1243. (2013).
  • Idir, M., Mercère, P., Moreno, T., Delmotte, A., Jae-Young Choi & Seungyu Rah "Metrology and Tests Beamline at SOLEIL" Paper presented at the Ninth International Conference on Synchrotron Radiation Instrumentation 28 May-2 June 2006. Jae-Young Choi & Seungyu Rah, 879: 619-622. (2006).
  • Thomasset, M., Moreno, T., Capitanio, B., Idir, M., Bucourt, S. "In-situ metrology for the optimization of bent crystals used in hard-X-ray monochromators: Comparison between measurement and simulation" Nuclear Instruments and Methods A., 616(2-3): 197-202. (2010).
  • Mercère, P. "Métrologie à SOLEIL : optique en rayons X" Photoniques., 72: 39-41. (2014).