PUBLICATIONS

Last update : 24/06/2026
  • Duboz, J.Y., Frayssinet, E., Chenot, S., Reverchon, J.L., Idir, M. "X-ray detectors based on GaN Schottky diodes" Applied Physics Letters., 97(16): art.n° 163504. (2010).
  • Rizzi, J., Mercère, P., Idir, M., Da Silva, P., Vincent, G., Primot, J. "X-ray phase contrast imaging and noise evaluation using a single phase grating interferometer" Optics Express., 21(14): 17340-17351. (2013).
  • Mercère, P., Idir, M., Moreno, T., Cauchon, G., Dovillaire, G., Levecq, X., Bucourt, S. "X-Ray Wavefront Measurements And Automatic Alignment Of X-Ray Beamlines" Paper presented at the Third International Workshop on Metrology for X-ray Optics- SRI 2006. Abstract No.34030008. (2006).
  • Firsov, A., Belkhou, R., Idir, M., Svintsov, A., Zaitsev, S., Ferlazzo, L., Cambril, E., AIP Conference Proceedings "Germanium-Based Circular Zone Plates for Soft and Hard X-Rays" Paper presented at the The 10th International Conference on X-ray Microscopy, 15-20/08/2010, Chicago (US). 1365: 84-87. (2011).
  • Sampaio, J.M., Madeira, T.I., Marques, J.P., Parente, F., Costa, A.M., Indelicato, P., Santos, J.P., Lépy, M.C., Ménesguen, Y. "Approaches for theoretical and experimental determinations of K -shell decay rates and fluorescence yields in Ge" Physical Review A., 89(1): art.n° 012512. (2014).
  • Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Polack, F., Idir, M., Mercère, P., Moreno, T., Brochet, S. "A Shack-Hartmann measuring head for the two-dimensional characterization of X-ray mirrors" Journal of Synchrotron Radiation., 15(2): 134-139. (2008).
  • Emprin, B., Troussel, P., Villette, B., Delmotte, F., Proceedings of SPIE "Spectral filtering optimization of a measuring channel of an X-ray broadband spectrometer" Paper presented at the Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III, 15 - 18 April 2013, Prague, Czech Republic. 8777: art.n° 87771B-1. (2013).
  • Rommeveaux, A., Thomasset, M., Cocco, D., Siewert, F., SPIE "First report on a European Round Robin for slope measuring profilers" Paper presented at the Advances in metrology for x-ray and EUV optics. 5921: 59210I.1-59210I.12. (2005).
  • Idir, M., Fricker, S., Modi, M.H., Potier, J. "X-ray digital wavefront sensor development" Nuclear Instruments and Methods A., 616(2-3): 255-260. (2010).
  • Stanescu, S., Mocuta, C., Merlet, F., Barbier, A. "Two-dimensional resonant magnetic soft X-ray scattering set-up for extreme sample environment" Journal of Synchrotron Radiation., 20(1): 181-189. (2013).