PUBLICATIONS

Last update : 09/03/2026
  • Belkhou, R., Cinquin, B., Jamme, F., Jaouen, N., Medjoubi, K., Quinkal, I., Vantelon, D., Refregiers, M. "Microscopies synchrotron à SOLEIL" Photoniques., 72: 30-33. (2014).
  • Bezencenet, O., Barbier, A., Ohresser, P., Belkhou, R., Stanescu, S., Magnan, H, Tonnerre, J.M., Grenier, S., Guittet, M.J. "Evidence of the exchange coupling in the Co/a-Fe2O3 system" Journal of Physics Conferences Series., 100(7): art.n° 072027. (2008).
  • Menon, K.S.R., Mandal, S., Das, J., Mentes, T.O., Niño, M.A., Locatelli, A., Belkhou, R. "Surface antiferromagnetic domain imaging using low-energy unpolarized electrons" Physical Review B., 84(13): art.n° 132402. (2011).
  • Rioult, M., Belkhou, R., Magnan, H, Stanescu, D., Stanescu, S., Maccherozzi, F., Rountee, C., Barbier, A. "Local Electronic Structure and Photoelectrochemical Activity of Partial Chemically Etched Ti-Doped Hematite" Surface Science., 641: 310-313. (2015).
  • Moreschini, L., Bendounan, A., Gierz, I., Ast, C.R., Mirhosseini, H., Höchst, H., Kern, K., Henk, J., Ernst, A., Ostanin, S., Reinert, F., Grioni, M. "Assessing the atomic contribution to the Rashba spin-orbit splitting in surface alloys: Sb/Ag(111)" Physical Review B., 79(7): art.n° 075424. (2009).
  • Ouerghi, A., Silly, M.G., Marangolo, M., Mathieu, C., Eddrief, M., Picher, M., Sirotti, F., El Moussaoui, S., Belkhou, R. "Large Area and High-Quality Epitaxial Graphene on Off-Axis SiC Wafers" ACS Nano., 6(7): 6075-6082. (2012).
  • Swaraj, S., Wang, C., Yan, H., Watts,, Lüning, J., McNeill, C.R., Ade, H. "Nanomorphology of Bulk Heterojunction Photovoltaic Thin Films Probed with Resonant Soft X-ray Scattering" Nano Letters., 10(8): 2863-2869. (2010).
  • Gogneau, N., Ben Gouider Trabelsi, A., Silly, M.G., Ridene, M., Portail, M., Michon, A., Oueslati, M., Belkhou, R., Sirotti, F., Ouerghi, A. "Investigation of structural and electronic properties of epitaxial graphene on 3C–SiC(100)/Si(100) substrates" Nanotechnology, Science and Applications., 7: 85—95. (2014).
  • Cheynis, F., Rougemaille, N., Belkhou, R., Toussaint, J.C., Fruchart, O. "X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism investigation of size effects on field-induced Néel-cap reversal" Journal of Applied Physics., 103(7): art.n° 07D915. (2008).
  • Ouerghi, A., Ridene, M., Balan, A., Belkhou, R., Barbier, A., Gogneau, N., Portail, M., Michon, A., Latil, S., Jegou, P., Shukla, A. "Sharp interface in epitaxial graphene layers on 3C-SiC(100)/Si(100) wafers" Physical Review B., 83(20): art.n° 205429. (2011).