PUBLICATIONS

Last update : 15/06/2026
  • Hamon, G., Vaissiere, N., Lausecker, C., Gariou, R., Chen, W., Alvarez, J., Maurice, J.L., Patriarche, G., Largeau, L., Decobert, J., Kleider, P., Roca i Cabarrocas, P. "Heteroepitaxial growth of silicon on GaAs via low-temperature plasma-enhanced chemical vapor deposition" Proceedings of SPIE., 10926: art.n° 109261C. (2019).
  • Purushottam Raj Purohit, R.R.P., Arya, A., Bojjawar, G., Pelerin, M., Van Petegem, S., Proudhon, H., Mukherjee, S., Gerard, C., Signor, L., Mocuta, C., Casati, N., Suwas, S., Chokshi, A.H., Thilly, L. "Revealing the role of microstructure architecture on strength and ductility of Ni microwires by in-situ synchrotron X-ray diffraction" Scientific Reports., 9: art.n° 79. (2019).
  • Sadat, T., Faurie, D., Tingaud, D., Mocuta, C., Thiaudiere, D., Dirras, G. "Fracture behavior of Ni-W alloy probed by in situ synchrotron X-ray diffraction" Materials Letters., 239: 116-119. (2019).
  • Colboc, H., Moguelet, P., Bazin, D., Descamps, V., Jouanneau, C., Reguer, S., Kluger, N. "Caractérisation chimique et topographique des métaux lourds au cours des réactions cutanées aux tatouages" Annales de Dermatologie et de Vénéréologie., 145(12 (suppl.)): S63-S64. (2018).
  • Faurie, D., Zighem, F., Godard, P., Parry, G., Sadat, T., Thiaudière, D., Renault, P.O. "In situ x-ray diffraction analysis of 2D crack patterning in thin films" Acta Materialia., 165: 177-182. (2019).
  • Mapes, R.H., Landman, N.H., Klug, C. "Caught in the act? Distraction sinking in ammonoid cephalopods" Swiss Journal of Palaeontology., 138(1): 141–149. (2019).
  • Ben Yahia, B., Amara, M.S., Gallard, M., Burle, N., Escoubas, S., Guichet, C., Putero, M., Mocuta, C., Richard, M.I., Chahine, R., Sabbione, C., Bernard, M., Fellouh, L., Noé, P., Thomas, O. "In situ monitoring of stress change in GeTe thin films during thermal annealing and crystallization" Micro and Nano Engineering., 1: 63-67. (2018).
  • Cook, P.K., Mocuta, C., Dufour, E., Languille, M.A., Bertrand, L. "Full‐section otolith microtexture imaged by local‐probe X‐ray diffraction" Journal of Applied Crystallography., 51(4): 1182-1196. (2018).
  • Jedrecy, N., Aghavnian, T., Moussy, J.B., Magnan, H, Stanescu, D., Portier, X., Arrio, M.A., Mocuta, C., Belkhou, R., Ohresser, P., Barbier, A. "Cross-Correlation between Strain, Ferroelectricity, and Ferromagnetism in Epitaxial Multiferroic CoFe2O4/BaTiO3 Heterostructures" ACS Applied Materials & Interfaces., 10(33): 28003–28014. (2018).
  • Noé, P., Hippert, F. "Structure and Properties of Chalcogenide Materials for PCM" In Phase Change Memory. Device Physics, Reliability and Applications: 125-179: Springer, 2018. ISBN: 978-3-319-69053-7