PUBLICATIONS

Last update : 09/03/2026
  • Brayard, A., Gueriau, P., Thoury, M., Escarguel, G. "Glow in the dark: use of synchrotron μXRF trace elemental mapping and multispectral macro-imaging on fossils from the Paris Biota (Bear Lake County, Idaho, USA)" Geobios., 54: 71-79. (2019).
  • Saucède, T., Vennin, E., Fara, E., Olivier, N., The Paris Biota Team, "A new holocrinid (Articulata) from the Paris Biota (Bear Lake County, Idaho, USA) highlights the high diversity of Early Triassic crinoids" Geobios., 54: 45-53. (2019).
  • van Stiphout, K., Geenen, F.A., Santos, N.M., Miranda, S.M.C., Joly, V., Demeulemeester, J., Detavernier, C., Kremer, F., Pereira, L.M.C., Temst, K., Vantomme, A. "Impurity-enhanced solid-state amorphization: the Ni-Si thin lm reaction altered by nitrogen" Journal of Physics D : Applied Physics., 52(14): art.n° 145301. (2019).
  • Hamon, G., Vaissiere, N., Lausecker, C., Gariou, R., Chen, W., Alvarez, J., Maurice, J.L., Patriarche, G., Largeau, L., Decobert, J., Kleider, P., Roca i Cabarrocas, P. "Heteroepitaxial growth of silicon on GaAs via low-temperature plasma-enhanced chemical vapor deposition" Proceedings of SPIE., 10926: art.n° 109261C. (2019).
  • Purushottam Raj Purohit, R.R.P., Arya, A., Bojjawar, G., Pelerin, M., Van Petegem, S., Proudhon, H., Mukherjee, S., Gerard, C., Signor, L., Mocuta, C., Casati, N., Suwas, S., Chokshi, A.H., Thilly, L. "Revealing the role of microstructure architecture on strength and ductility of Ni microwires by in-situ synchrotron X-ray diffraction" Scientific Reports., 9: art.n° 79. (2019).
  • Sadat, T., Faurie, D., Tingaud, D., Mocuta, C., Thiaudiere, D., Dirras, G. "Fracture behavior of Ni-W alloy probed by in situ synchrotron X-ray diffraction" Materials Letters., 239: 116-119. (2019).
  • Colboc, H., Moguelet, P., Bazin, D., Descamps, V., Jouanneau, C., Reguer, S., Kluger, N. "Caractérisation chimique et topographique des métaux lourds au cours des réactions cutanées aux tatouages" Annales de Dermatologie et de Vénéréologie., 145(12 (suppl.)): S63-S64. (2018).
  • Faurie, D., Zighem, F., Godard, P., Parry, G., Sadat, T., Thiaudière, D., Renault, P.O. "In situ x-ray diffraction analysis of 2D crack patterning in thin films" Acta Materialia., 165: 177-182. (2019).
  • Mapes, R.H., Landman, N.H., Klug, C. "Caught in the act? Distraction sinking in ammonoid cephalopods" Swiss Journal of Palaeontology., 138(1): 141–149. (2019).
  • Ben Yahia, B., Amara, M.S., Gallard, M., Burle, N., Escoubas, S., Guichet, C., Putero, M., Mocuta, C., Richard, M.I., Chahine, R., Sabbione, C., Bernard, M., Fellouh, L., Noé, P., Thomas, O. "In situ monitoring of stress change in GeTe thin films during thermal annealing and crystallization" Micro and Nano Engineering., 1: 63-67. (2018).