PUBLICATIONS

Last update : 07/11/2026
  • Danard, Y., Martin, G., Lilensten, L., Sun, F., Seret, A., Poulain, R., Mantri, S., Guillou, R., Thiaudière, D., Freiherr von Thüngen, I., Galy, D., Piellard, M., Bozzolo, N., Banerjee, R., Prima, F. "Accommodation mechanisms in strain-transformable titanium alloys" Materials Science and Engineering A., 819: art.n° 141437. (2021).
  • Thomas, O., Mocuta, C., Putero, M., Richard, M.I., Boivin, P., Arnaud, F. "Crystallization behavior of N -doped Ge-rich GST thin films and nanostructures: An in-situ synchrotron X-ray diffraction study" Microelectronic Engineering., 244-246: art.n° 111573. (2021).
  • Mudronja, D., Vanmeert, F., Fazinic, S., Janssens, K., Tibljas, D., Desnica, V. "Protection of Stone Monuments Using a Brushing Treatment with Ammonium Oxalate" Coatings., 11(4): art.n° 379. (2021).
  • Troughton, J.G., Marchiori, B., Delattre, R., Escoubas, S., Aliouat, M.Y., Grigorian, S., Ramuz, M. "Raw and processed data used in the simultaneous analysis of electrical characteristics and microstructure of crystallised PEDOT:PSS based OECTs under strain" Data in Brief., 35: art.n° 106946. (2021).
  • Troughton, J.G., Marchiori, B., Delattre, R., Escoubas, S., Aliouat, M.Y., Grigorian, S., Ramuz, M. "Simultaneous measurement of electrical characteristics and microstructure of crystallised PEDOT:PSS based OECTs under strain" Organic Electronics., 92: art.n° 106108. (2021).
  • Queraltó, A., Banchewski, J., Pacheco, A., Gupta, K., Saltarelli, L., Garcia, D., Alcalde, N., Mocuta, C., Ricart, S., Pino, F., Obradors, X., Puig, T. "Combinatorial Screening of Cuprate Superconductors by Drop-On-Demand Inkjet Printing" ACS Applied Materials & Interfaces., 13(7): 9101-9112. (2021).
  • Cordill, M.J., Kreiml, P., Putz, B., Mitterer, C., Thiaudière, D., Mocuta, C., Renault, P.O., Faurie, D. "Role of layer order on the equi-biaxial behavior of Al/Mo bilayers" Scripta Materialia., 194: art.n° 113656. (2021).
  • Aggar, L., Bradai, D., Bourezg, Y.I., Abdesselam, M., Chami, A.C., Mocuta, C., Thiaudiere, D., Speisser, C., Muller, D., Bouillet, C., Le Normand, F. "GaN nanocrystals obtained by Ga and N implantations and thermal treatment under N2 into SiO2/Si and SiNx/Si wafers" Nuclear Instruments and Methods B., 485: 57-67. (2020).
  • van Stiphout, K., Geenen, F.A., Santos, N.M., Miranda, S.M.C., Joly, V., Demeulemeester, J., Mocuta, C., Comrie, C.M., Detavernier, C., Pereira, L.M.C., Temst, K., Vantomme, A. "Ion beam modification of the Ni-Si solid-phase reaction: The influence of substrate damage and nitrogen impurities introduced by ion implantation" Journal of Physics D: Applied Physics., 54(1): art.n° 015307. (2021).
  • Sadat, T., Faurie, D., Thiaudière, D., Mocuta, C., Tingaud, D., Dirras, G. "Lattice Strain Evolutions in Ni-W Alloys during a Tensile Test Combined with Synchrotron X-ray Diffraction" Materials., 13(18): art.n° 4027. (2020).