Andreas STIERLE
(Deutsches Elektronen Synchrotron (DESY) and Universität Hamburg, Physics Department, Germany)
In conventional x-ray experiments on nanomaterials, the x-ray beam is performing a spatio-temporal ensemble average which is smearing out information on individual nano objects. Using coherent, nano-focused x-ray beams imaging of single nano objects becomes feasible. In my presentation I will highlight present methods such as coherent diffractive and ptychographic x-ray imaging. Further on, I will illustrate, which novel science can be addressed by x-ray beams produced at future synchrotron storage rings equipped with multi-bent achromatic accelerator technology in combination with complementary nano characterization methods. Conventional surface sensitive diffraction methods can be combined with beam sizes in the 10 nm regime, allowing one to collect local structural and chemical information. A special strength of x-ray methods is their compatibility with harsh operando or in-situ growth conditions.
Entrance formalities:
Free access in the auditorium of the Reception building.
If the manifestation takes place in the main building thank you for providing an ID card (to exchange at the reception for an access pass)
Contact: Sandrine Vasseur
Downloads
sem-190415-stierle.pdf (272.44 KB - pdf) (272.44 KB)