Rainer H. Fink
(Friedrich-Alexander-University of Erlangen, Nürnberg, Germany)
Zone-plate based soft x-ray microspectroscopy has developed into a routine technique to analysing all kind of materials. Specifically the investigation of molecule-based materials gains from the chemical fingerprint sensitivity of near-edge x-ray absorption fine structure. We will discuss various applications of the SLS PolLux-STXM to soft matter specimens, ranging from polymer materials, polymer blends, organic nanocrystals and in-operando studies of organic electronic thin film devices. Since spatial resolution in state-of-the-art zone plate-based microscopy is limited, complementary techniques are required that offer chemical insight also beyond the present STXM resolution level. Therefore, soft x-ray resonant scattering has been employed to resolve structures in the sub-10 nm regime.
Entrance formalities:
Free access in the auditorium of the Reception building.
If the manifestation takes place in the main building thank you for providing an ID card (to exchange at the reception for an access pass)
Contact: Sandrine Vasseur
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