Seminar - Nanomaterials in the light of soft x-rays

Gisela SCHUTZ

(Max Planck Institute for Intelligent Systems, Stuttgart, Germany)

Advanced soft x-ray microscopy provides an element-specific visualization of nanostructures with lateral resolution of typically 20 nm using Fresnel Zone Plate optics and 3 nm on the basis of coherent imaging via ptychography. The department Schütz runs an own scanning x-ray microscope at the storage ring BESSY II in Berlin. Chemical and magnetic maps of the specimen are taken using the spectroscopic techniques of NEXAFS and XMCD as contrast mechanism. By different detection modes surface and bulk contributions can be monitored at once as demonstrated for Li battery particles. Fast single photon detectors allow stroboscopic imaging with time resolutions limited only by the time structure of the synchrotron with typically 10 – 100 ps flashes. The unique combination of spatial and time resolution gives excellent possibilities to investigate nanoscale magnetization dynamics and model devices covering a wide field of spintronics and magnonics.

Entrance formalities:

Free access in the auditorium of the Reception building.
If the manifestation takes place in the main building thank you for providing an ID card (to exchange at the reception for an access pass)

Contact: Sandrine Vasseur