Course to Advanced Techniques of Synchrotron radiation

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June 19<sup>th</sup>, 2017 • Synchrotron SOLEIL


Synchrotron SOLEIL and the French Vacuum Society (SFV) are happy to offer the fourth edition of this training. The previous three were highly successful indeed, with the participation of students, young researchers and academic research management, together with commercial innovation centres.

Objective

Where technological development is concerned, advanced methods for characterisation and analysis using synchrotron radiation have become indispensable for the gathering of structural, chemical, mechanical, electronic and magnetic information at the atomic and molecular scale for products and materials with a high value added.

This training, intended for a very varied public, is aimed at not only providing essential information for access to synchrotron radiation centres, but is also aimed at providing the knowledge necessary for use of the main techniques available in these facilities. Likewise the course provides the participants with a clear understanding of the criteria which determine effective selection of analysis methods. 

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Public concerned

  • Higher level technicians, engineers, management staff, researchers and Phd students from both industrial and academic environments.
  • Laboratories, R&D, production, control, technical support
  • Sectors involved in characterisation of functional materials, classical materials, nanomaterials, corrosion and aging, plastics and composites, surface treatments, surface preparation and gluing, treatment of metals and alloys.

Programme

  • Comparative presentation of the various techniques available in the synchrotron radiation centres and methods for characterisation available in conventional laboratories
  • Preparation and handling of samples under vacuum, ion bombardment, annealing, evaporation, dosage, etc
  • X-ray absorption spectroscopy (XAS) studies of various materials: semiconductors, insulators and metals. Elemental and chemical analysis (calibration, uncertainties and assignment of spectra)
  • Spectroscopic analysis by photo-electron emission spectroscopy (PES) of materials of varying complexity (semiconductors, oxides and metals)
  • Imaging of materials at different scales, from nanometre to millimetre using X-ray absorption contrast imaging
  • Diffraction study for determination of the local order of various materials
  • Acquisition and processing of data directly on a beamline of the SOLEIL Synchrotron