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Spatio-temporal imaging of strain and structure in devices and nanostructures by X-ray nano diffraction imaging methods Tobias U. SCHÜLLI - (ESRF, Grenoble) Mardi 16 décembre 2025 – 14h00 - Amphithéâtre SOLEIL Spatially resolving X-ray diffraction based tools are of relevance for the characterization of most emerging nanomaterials or electronic devices. While typical samples for these...