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SixS (Surfaces interfaces x-ray Scattering) is a wide-energy range (5 -20 keV) beamline dedicated to structural studies of interfaces (gas-solid, solid-solid or solid-liquid), as well as nano-objects.

SixS (Surfaces interfaces X-ray Scattering)  is a wide-energy range (5 -20 keV) beamline dedicated to structural characterization of surfaces, interfaces (solid-solid or solid-liquid), as well as nano-objects in controlled environments by means of surface-sensitive x-ray scattering techniques, such as:

Grazing Incidence X-ray Diffraction (GIXD)

Crystal Truncation Rods (CTR)

Grazing Incidence Small Angle X-ray Scattering (GISAXS)

Anomalous Surface X-ray Scattering

X-ray Reflectivity (XRR)

Coherent Scattering

Magnetic Surface X-ray Scattering (in the near future)

Experimental end-stations:

MED: a multi-environment diffractometer  is available which can accommodate various sample environments, such as high-pressure reactivity chambers, electrochemical cells, Langmuir troughs. It allows for scatvertical and horizontal diffraction geometry for surface / interface diffraction.

UHV:  the diffractometer is coupled to stationary assembly of UHV chambers (currently being installed) ; it is a unique design, and consists of an assembly of three chambers equipped with the standard UHV tools (evaporators, ion-guns, etc.) and specific instruments (Scanning Tunneling Microscope (STM), Low Energy Electron Diffraction (LEED), Auger Electron Spectroscopy (AES).

Team

COATI
COATI Alessandro
Responsable Ligne De Lumière
GAUDRY
RESTA
RESTA Andrea
Scientifique de Ligne De Lumière
SAUVAGE
SAUVAGE Michele
Emérite
VLAD
VLAD Alina
Scientifique de Ligne De Lumière
VOISIN
VOISIN Benjamin
Assistant Ingénieur de Ligne De Lumière
Fourmental Cynthia
Dhanasekaran Venkatesan
Senior Process Manager @ Munoth Industries Ltd.
Lemoine Asseline
Wilson Axel
Post-Doc
Bellec Amandine
CNRS Researcher @ MPQ - Université de Paris
Chambon Carole

to be completed

Available techniques

Technical Data

Energy range

5 - 20 keV

Resolving Power

E/ΔE ~ 104 @ 20 keV

Source

In-vacuum U20 undulator
Source Size (sigma, μm): 388 (H) x 8.1 (V)
Source Divergence (sigma, μrad): 14.5 (H) x 4.6 (V)

Optics

Diaphragm

Fixed exit DCM Si(111)

M1, M2 mirror for harmonics rejection and vertical focussing

M3B for horizontal focussing on the UHV end-station

Fresnel Zone Plates (on demand)

Experimental End-Stations

MED:  Multi-Environment Diffractometer

UHV: diffractometer coupled to an UHV vacuum chamber assembly

Beam Size at Sample Position

MED: 1500(H) x 25(V) µm(not focused horizontally)

UHV: 30(H) x 30(V) µm2

Beam Divergence at Sample Position

MED: 20 µrad (H) x 120 µrad (V)

UHV: 600 µrad (H) x 60 µrad (V)

Flux

4 x 1013 ph/s @ 6 keV

3 x 1012 ph/s @ 15 keV

Beam Polarisation

horizontal (linear)

Scientific opportunities

To be filled

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