RECHERCHER

... Joseph, J., Holzmeier, F., Bresteau, D., Ruchon, T., Houver, J.C., Lucchese, R.R., Dowek, D. "Angularly resolved photoionization dynamics in atoms and molecules combining temporally and spectrally resolved experiments at ATTOLab and Synchrotron SOLEIL" ...

... Weitkamp, T., Scheel, M., Perrin, J., Daniel, G., King, A., Le Roux, V., Giorgetta, J.L., Carcy, A., Langlois, F., Desjardins, K., Menneglier, C., Cerato, M., Engblom, C., Cauchon, G., Moreno, T., Rivard, C., Gohon, Y., Polack, F. "Microtomography on the ...

... Bresteau, D., Spezzani, C., Tcherbakoff, O., Hergott, J.F., Lepetit, F., D’Oliveira, P., Salières, P., Géneaux, R., Luttmann, M., Vadillo-Torre, I., Lenfant, J., Weber, S.J., Dehlinger, M., Meltchakov, E., Delmotte, F., Bourassin-Bouchet, C., Im, J., Chen ...

... Huang, L., Lienhard, L., Wang, T., Polack, F., Nicolas, J., Hulbert, S., Idir, M. "Multi-pitch nano-accuracy surface profiler for strongly curved X-ray mirror metrology" Optics and Lasers in Engineering., 162: art.n° 107428. (2023). ...

... Mahmoud, A.H.K., de Rossi, S., Meltchakov, E., Capitanio, B., Thomasset, M., Vallet, M., Héripré, E., Delmotte, F. "Al/Mo/SiC multilayer diffraction gratings with broadband efficiency in the extreme ultraviolet" Optics Express., 30(21): 38319-38338. ...

... Huang, L., Wang, T., Polack, F., Nicolas, J., Nakhoda, K., Idir, M. "Measurement uncertainty of highly asymmetrically curved elliptical mirrors using multi-pitch slope stitching technique" Frontiers in Physics., 10: art.n° 880772. (2022). ...

... Kamel, G., Lefrancois, S., Moreno, T., Al-Najdawi, M., Momani, Y., Abbadi, A., Paolucci, G., Dumas, P. "The first infrared beamline at the Middle East SESAME synchrotron facility" Journal of Synchrotron Radiation., 28(6): 1927-1934. (2021). ...

... N'Diaye, A., Bordage, A., Nataf, L., Baudelet, F., Moreno, T., Bleuzen, A. "A cookbook for the investigation of coordination polymers by transition metal K-edge XMCD" Journal of Synchrotron Radiation., 28(4): 1127-1136. (2021). ...

... Huang, L., Wang, T., Nicolas, J., Polack, F., Zuo, C., Nakhoda, K., Idir, M. "Multi-pitch self-calibration measurement using a nano-accuracy surface profiler for X-ray mirror metrology" Optics Express., 28(16): 23060-23074. (2020). ...

... Après le redémarrage des accélérateurs et la mise en place d’une organisation spécifique, en particulier autour de la Salle de Contrôle, ce sont les lignes de lumière qui ont redémarré le mardi 26 mai. ...