RECHERCHER

... Etude de cas réalisée avec la start-up 3Dmagination  Grâce à l’amélioration de la qualité des faisceaux de rayons X, des détecteurs, des algorithmes de reconstruction et au développement de cellules in situ, l’étude non destructive de ...

... Agnelli, S., Baldi, F., Castellani, L., Pisoni, K., Vighi, M., Laiarinandrasana, L. "Study of the plastic deformation behavior of ductile polymers: Use of the material key curves" Mechanics of Materials., 117: 105-115. (2018). ...

... Fang, Q., Daymond, M.R., King, A. "Study on the morphology of bulk hydrides by synchrotron X-ray tomography" Materials Characterization., 134: 362-369. (2017). ...

... Laniel, D., Dewaele, A., Anzellini, S., Guignot, N. "Study of the iron nitride FeN into the megabar regime" Journal of Alloys and Compounds., 733: 53-58. (2018). ...

... Cornelius, T.W., Mocuta, C., Escoubas, S., Merabet, A., Texier, M., Lima, E.C., Araujo, E.B., Kholkin, A.L., Thomas, O. "Piezoelectric response and electrical properties of Pb(Zr1-xTix)O3 thin films: The role of imprint and composition" Journal of Applied ...

... Morard , G., Nakajima, Y., Andrault, D., Antonangeli, D., Auzende, A.L., Boulard, E., Cervera, S., Clark, A.N., Lord, O.T., Siebert, J., Svitlyk, V., Garbarino, G., Mezouar, M. "Structure and density of Fe-C liquid alloys under high pressure" Journal of ...

... van Stiphout, K., Geenen, F.A., De Schutter, B., Santos, N.M., Miranda, S.M.C., Joly, V., Detavernier, C., Pereira, L.M.C., Temst, K., Vantomme, A. "Formation of ultrathin Ni germanides: solid-phase reaction, morphology and texture" Journal of Physics D : ...

... Bolivar, J., Nguyen, T.T., Shi, Y., Fregonese, M., Réthoré, J., Adrien, J., King, A., Buffiere, J.Y., Huin, N. "Multiple Cracks Interactions in Stress Corrosion Cracking: In Situ Observation by Digital Image Correlation and Phase Field Modeling" In The ...

... Bellin, C., Mafety, A., Narayana, C., Giura, P., Rousse, G., Itié, J.P., Polian, A., Saitta, A.M., Shukla, A. "Disorder-order phase transition at high pressure in ammonium fluoride" Physical Review B., 96(9): art.n° 094110. (2017). ...

... Többens, D.M., Schorr, S. "The use of anomalous X-ray diffraction as a tool for the analysis of compound semiconductors" Semiconductor Science and Technology., 32(13): art.n° 103002. (2017). ...