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... André, T., Andriyash, I.A., Loulergue, A., Labat, M., Roussel, E., Ghaith, A., Khojoyan, M., Thaury, C., Valléau, M., Briquez, F., Marteau, F., Tavakoli, K., N’Gotta, P., Dietrich, Y., Lambert, G., Malka, V., Benabderrahmane, C., Vétéran, J., Chapuis, L., ...

... Freitas, R.O., Deneke, C., Maia, F.C.B., Medeiros, H.G., Moreno, T., Dumas, P., Petroff, Y., Westfahl, H. "Low-aberration beamline optics for synchrotron infrared nanospectroscopy" Optics Express., 26(9): 11238-11249. (2018). ...

... André, T., Andriyash, I.A., Loulergue, A., Labat, M., Roussel, E., Ghaith, A., Khojoyan, M., Thaury, C., Valléau, M., Briquez, F., Marteau, F., Tavakoli, K., N’Gotta, P., Dietrich, Y., Lambert, G., Malka, V., Benabderrahmane, C., Vétéran, J., Chapuis, L., ...

... Labat, M., Brubach, J.B., Ciavardini, A., Couprie, M.E., Elkaim, E., Fertey, P., Ferte, T., Hollander, P., Hubert, N., Jal, E., Laulhé, C., Luning, J., Marcouillé, O., Moreno, T., Morin, P., Polack, F., Prigent, P., Ravy, S., Ricaud, J.P., Roy, P., Silly, ...

... Moreno Fernández, H., Rogler, D., Sauthier, G., Thomasset, M., Dietsch, R., Carlino, V., Pellegrin, E. "Characterization of Carbon-Contaminated B4C-Coated Optics after Chemically Selective Cleaning with Low-Pressure RF Plasma." Scientific Reports., 8: ...

... Sheung, J., Qian, J., Sullivan, J., Thomasset, M., Manton, J., Bean, S., Takacs, P.Z., Dvorak, J., Assoufid, L. "Metrology of variable-line-spacing x-ray gratings using the APS Long Trace Profiler" Proceedings of SPIE., 10385: art.n° 1038508. (2017). ...