RECHERCHER

... Cocco, D., Thomasset, M. "Measurement of Groove Density of Diffraction Gratings" In Modern Developments in X-Ray and Neutron Optics: 207-211: Springer-Verlag, 2008. ISBN: 978-3-540-74560-0 ...

... Chubar, O., Couprie, M. E., Labat, M., Lambert, G., Polack, F., Tcherbakoff, O., "Time-dependent FEL wavefront propagation calculations: Fourier optics approach" Nuclear Instruments and Methods A., 593(1-2): 30-34. (2008). ...

... Susini, J., Cotte, M., Scheidt, K., Chubar, O., Polack, F., Dumas, P., "The FTIR spectro microscopy end-station at the ESRF-ID21 beamline" Synchrotron Radiation News., 20(5): 13-16. (2007). ...

... Sacchi, M., Spezzani, C., Carpentiero, A., Prasciolu, M., Delaunay, R., Lüning, J., Polack, F. "Experimental setup for lensless imaging via soft x-ray resonant scattering" Review of Scientific Instruments., 78(4): art.n° 043702. (2007). ...

... Panaccione, G., Vobornik, I., Fujii, J., Krizmancic, D., Annese, E., Giovanelli, L., Maccherozzi, F., Salvador, F., De Luisa, A., Benedetti, D., Gruden, A., Bertoch, P., Polack, F., Cocco, D., Sostero, G., Diviacco, B., Hochstrasser, M., Maier, U., Pescia ...

... Modi, M.H., Rai, S.K., Thomasset, M., Lodha, G.S., Idir, M. "Effect of surface roughness on multilayer film growth" European Physical Journal.-Special Topics., 167(1): 27-32. (2009). ...

... Giuliani, A., Jamme, F., Rouam, V., Wien, F., Giorgetta, J.L., Lagarde, B., Chubar, O., Bac, S., Yao, I., Rey, S., Herbeaux , C., Marlats, J.L., Zerbib, D., Polack, F., Réfregiers, M., "DISCO: a low-energy multipurpose beamline at synchrotron SOLEIL" ...

... de Oliveira, N., Joyeux, D., Phalippou, D., Rodier, J.C., Polack, F., Vervloet, M., Nahon, L. "A Fourier transform spectrometer without a beam splitter for the vacuum ultraviolet range: From the optical design to the first UV spectrum" Review of ...

... Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Polack, F., Idir, M., Mercère, P., Brochet, S., Moreno, T., Wolfgang Osten, Christophe Gorecki, Erik L. Novak "Surface metrology with a stitching Shack-Hartmann profilometric head" Paper presented at ...

... Thomasset, M., Brochet, S., Idir, M., Moreno, T., Polack, F., Carré, J.F., AIP "Metrology results on multielectrod bimorph mirrors" Paper presented at the Third International Workshop on Metrology for X-ray Optics- SRI 2006. AIP, Abstract n° 34050015. ...