RECHERCHER

... Ciatto, G., Thomasset, M., Glas, F., Lu, X., Tiedje, T. "Formation and vanishing of short range ordering in GaAs1-xBix thin films" Physical Review B., 82(20): art.n° 201304. (2010). ...

... Thomasset, M., Polack, F. "Simultaneous estimation of the surface shape and the instrument error function from a highly redundant set of LTP data" Paper presented at the Workshop on X-ray and XUV Active Optics 2nd, 9-11 October 2008. (2008). ...

... Thomasset, M., Polack, F. "Characterization of optical surfaces for the present generations of synchrotron sources" Paper presented at the 9th International Symposium on Laser Metrology - 30 June - 2 July 2008 Singapore. 7155: art.n° 715506. (2008). ...

... Stötzel, J., Lützenkirchen-Hecht, D., Fonda, E., De Oliveira, N., Briois, V., Frahm, R. "Novel angular encoder for a quick-extended x-ray absorption fine structure monochromator" Review of Scientific Instruments., 79(8): art.n° 083107. (2008). ...

... Rommeveaux, A., Thomasset, M., Cocco, D., Siewert, F. "The COST P7 Round Robin for Slope Measuring Profilers" In Modern Developments in X-Ray and Neutron Optics: 213-218: Springer-Verlag, 2008. ISBN: 978-3-540-74560-0 ...

... Rommeveaux, A., Thomasset, M., Cocco, D. "The Long Trace Profilers" In Modern Developments in X-Ray and Neutron Optics: 181-191: Springer-Verlag, 2008. ISBN: 978-3-540-74560-0 ...

... Joyeux, D., de Oliveira, M.A., Phalippou, D., Rodier, J.C., Ito, K., Nahon, L., Vervloet, M., Polack, F., Roudjane, M. "Spectrométrie VUV par transformation de Fourier à très haute résolution : état et performances du nouvel instrument installé à SOLEIL" ...

... Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Polack, F., Idir, M., Mercère, P., Moreno, T., Brochet, S. "A Shack-Hartmann measuring head for the two-dimensional characterization of X-ray mirrors" Journal of Synchrotron Radiation., 15(2): 134-139. ...

... Desjardins, K., Hustache, S., Polack, F., Moreno, T., Dubuisson, J.M., Chubar, O., Delmotte, F., IEEE NUCLEAR SCIENCE SYMPOSIUM - CONFERENCE RECORD, "The DiagOn : an Undulator Diagnostic for SOLEIL Low Energy Beamlines" Paper presented at the IEEE Nuclear ...

... de Rossi, S., Joyeux, D., Chavel, P., de Oliveira, N., Richard, M., Constancias, C., Robic, J.Y. "Probing multilayer stack reflectors by low coherence interferometry in extreme ultraviolet" Applied Optics., 147(12): 2109-2115. (2008). ...