RECHERCHER
Résultats de la recherche ""
Understanding reversal effects of metallic aluminum introduced in HfSiON/TiN PMOSFETs
Publié le 10/11/2016
... Baudot, S., Leroux, C., Chave, F., Boujamaa, R., Martinez, E., Caubet, P., Silly, M.G., Sirotti, F., Reimbold, G., Ghibaudo, G. "Understanding reversal effects of metallic aluminum introduced in HfSiON/TiN PMOSFETs" Microelectronic Engineering., 88(7): ...
Current-induced motion and pinning of domain walls in spin-valve nanowires studied by XMCD-PEEM
Publié le 10/11/2016
... Uhlír, V., Pizzini, S., Rougemaille, N., Novotný, J., Cros, V., Jiménez, E., Faini, G., Heyne, L., Sirotti, F., Tieg, C., Bendounan, A., Maccherozzi, F., Belkhou, R., Grollier, J., Anane, A., Vogel, J. "Current-induced motion and pinning of domain walls ...
TEMPO: a New Insertion Device Beamline at SOLEIL for Time Resolved Photoelectron Spectroscopy Experiments on Solids and Interfaces
Publié le 10/11/2016
... Polack, F., Silly, M.G., Chauvet, C., Lagarde, B., Bergeard, N., Izquierdo, M., Chubar, O., Krizmancic, D., Ribbens, M., Duval, J.P., Basset, C., Kubsky, S., Sirotti, F. "TEMPO: a New Insertion Device Beamline at SOLEIL for Time Resolved Photoelectron ...
Epitaxial graphene on 3C-SiC(111) pseudosubstrate: Structural and electronic properties
Publié le 10/11/2016
... Ouerghi, A., Marangolo, M., Belkhou, R., El Moussaoui, S., Silly, M.G., Eddrief, M., Largeau, L., Portail, M., Fain, B., Sirotti, F. "Epitaxial graphene on 3C-SiC(111) pseudosubstrate: Structural and electronic properties" Physical Review B., 82(12): art ...
Structural coherency of epitaxial graphene on 3C–SiC(111) epilayers on Si111
Publié le 10/11/2016
... Ouerghi, A., Belkhou, R., Marangolo, M., Silly, M.G., El Moussaoui, S., Eddrief, M., Largeau, L., Portail, M., Sirotti, F. "Structural coherency of epitaxial graphene on 3C–SiC(111) epilayers on Si111" Applied Physics Letters., 97(16): art.n° 161905. ...
Internal Structure of InP/ZnS Nanocrystals Unraveled by High-Resolution Soft X-ray Photoelectron Spectroscopy
Publié le 10/11/2016
... Huang, K., Demadrille, R., Silly, M.G., Sirotti, F., Reiss, P., Renault, O. "Internal Structure of InP/ZnS Nanocrystals Unraveled by High-Resolution Soft X-ray Photoelectron Spectroscopy" ACS Nano., 4(8): 4799-4805. (2010). ...
A Synchrotron Radiation X-ray Photoemission Spectroscopy Study of n-Propyltriethoxysilane Adsorption on Si(001)-2 × 1 at Room Temperature
Publié le 10/11/2016
... Gallet, J.J., Bournel, F., Pierucci, D., Bonato, M., Khaliq, A., Rochet, F., Silly, M.G., Sirotti, F. "A Synchrotron Radiation X-ray Photoemission Spectroscopy Study of n-Propyltriethoxysilane Adsorption on Si(001)-2 × 1 at Room Temperature" Journal of ...
High oxidation state at the epitaxial interface of y-Al2O3 thin films grown on Si(111) and Si(001)
Publié le 10/11/2016
... El Kazzi, M., Merckling, C., Saint-Girons, G., Grenet, G., Silly, M.G., Sirotti, F., Hollinger, G. "High oxidation state at the epitaxial interface of y-Al2O3 thin films grown on Si(111) and Si(001)" Applied Physics Letters., 97(15): art.n° 151902. (2010 ...
Spin reorientation transition and phase diagram in an He+ ion irradiated ultrathin Pt/Co(0.5 nm)/Pt film
Publié le 10/11/2016
... Bergeard, N., Jamet, J.P., Ferré, J., Mougin, A., Fassbender, J. "Spin reorientation transition and phase diagram in an He+ ion irradiated ultrathin Pt/Co(0.5 nm)/Pt film" Journal of Applied Physics., 108(10): art.n° 103915. (2010). ...
Influence of the ferroelectric polarization on the electronic structure of BaTiO3 thin films
Publié le 10/11/2016
... Barrett, N., Rault, J., Krug, I., Vilquin, B., Niu, G., Gautier, B., Albertini, D., Lecoeur, P., Renault, O. "Influence of the ferroelectric polarization on the electronic structure of BaTiO3 thin films" Surface and Interface Analysis., 42(12-13): 1690 ...