RECHERCHER
Résultats de la recherche ""
Nanoscopium: a Scanning Hard X-ray Nanoprobe Beamline at Synchrotron Soleil
Publié le 10/11/2016
... Somogyi, A., Polack, F., Moreno, T. "Nanoscopium: a Scanning Hard X-ray Nanoprobe Beamline at Synchrotron Soleil" Paper presented at the SRI 2009, 10th International Conference on Synchrotron Radiation Instrumentation, Melbourne, Australia, 27 September - ...
TEMPO: a New Insertion Device Beamline at SOLEIL for Time Resolved Photoelectron Spectroscopy Experiments on Solids and Interfaces
Publié le 10/11/2016
... Polack, F., Silly, M.G., Chauvet, C., Lagarde, B., Bergeard, N., Izquierdo, M., Chubar, O., Krizmancic, D., Ribbens, M., Duval, J.P., Basset, C., Kubsky, S., Sirotti, F. "TEMPO: a New Insertion Device Beamline at SOLEIL for Time Resolved Photoelectron ...
Epitaxial graphene on 3C-SiC(111) pseudosubstrate: Structural and electronic properties
Publié le 10/11/2016
... Ouerghi, A., Marangolo, M., Belkhou, R., El Moussaoui, S., Silly, M.G., Eddrief, M., Largeau, L., Portail, M., Fain, B., Sirotti, F. "Epitaxial graphene on 3C-SiC(111) pseudosubstrate: Structural and electronic properties" Physical Review B., 82(12): art ...
Structural coherency of epitaxial graphene on 3C–SiC(111) epilayers on Si111
Publié le 10/11/2016
... Ouerghi, A., Belkhou, R., Marangolo, M., Silly, M.G., El Moussaoui, S., Eddrief, M., Largeau, L., Portail, M., Sirotti, F. "Structural coherency of epitaxial graphene on 3C–SiC(111) epilayers on Si111" Applied Physics Letters., 97(16): art.n° 161905. ...
Scanning transmission X-ray microscopy with a fast framing pixel detector
Publié le 10/11/2016
... Menzel, A., Kewish, C.M., Kraft, P., Henrich, B., Jefimovs, K., Vila-Comamala, J., David, C., Dierolf, M., Thibault, P., Pfeiffer, F., Bunk, O. "Scanning transmission X-ray microscopy with a fast framing pixel detector" Ultramicroscopy., 110(9): 1143 ...
Inversion domain boundaries in GaN studied by X-ray microprobe
Publié le 10/11/2016
... Martinez-Criado, G., Somogyi, A., Alén, B., Miskys, C., Tucoulou, R., Cloetens, P., Sans, J.A., Susini, J. "Inversion domain boundaries in GaN studied by X-ray microprobe" Physica Status Solidi - Rapid Research Letters., 4(1): 31-33. (2010). ...
Reconstruction of an astigmatic hard X-ray beam and alignment of K-B mirrors from ptychographic coherent diffraction data
Publié le 10/11/2016
... Kewish, C.M., Guizar-Sicairos, M., Liu, C.A., Qian, J., Shi, B., Benson, C., Khounsary, A.M., Vila-Comamala, J., Bunk, O., Fienup, J.R., Macrander, A.T., Assoufid, L. "Reconstruction of an astigmatic hard X-ray beam and alignment of K-B mirrors from ...
Internal Structure of InP/ZnS Nanocrystals Unraveled by High-Resolution Soft X-ray Photoelectron Spectroscopy
Publié le 10/11/2016
... Huang, K., Demadrille, R., Silly, M.G., Sirotti, F., Reiss, P., Renault, O. "Internal Structure of InP/ZnS Nanocrystals Unraveled by High-Resolution Soft X-ray Photoelectron Spectroscopy" ACS Nano., 4(8): 4799-4805. (2010). ...
A Synchrotron Radiation X-ray Photoemission Spectroscopy Study of n-Propyltriethoxysilane Adsorption on Si(001)-2 × 1 at Room Temperature
Publié le 10/11/2016
... Gallet, J.J., Bournel, F., Pierucci, D., Bonato, M., Khaliq, A., Rochet, F., Silly, M.G., Sirotti, F. "A Synchrotron Radiation X-ray Photoemission Spectroscopy Study of n-Propyltriethoxysilane Adsorption on Si(001)-2 × 1 at Room Temperature" Journal of ...
High oxidation state at the epitaxial interface of y-Al2O3 thin films grown on Si(111) and Si(001)
Publié le 10/11/2016
... El Kazzi, M., Merckling, C., Saint-Girons, G., Grenet, G., Silly, M.G., Sirotti, F., Hollinger, G. "High oxidation state at the epitaxial interface of y-Al2O3 thin films grown on Si(111) and Si(001)" Applied Physics Letters., 97(15): art.n° 151902. (2010 ...