RECHERCHER
Résultats de la recherche ""
Bandgap inhomogeneity of MoS2 monolayers on epitaxial graphene bilayers in van der Waals p-n junctions
Publié le 10/11/2016
... Ben Aziza, Z., Henck, H., Di Felice, D., Pierucci, D., Chaste, J., Naylor, C.H., Balan, A., Dappe, Y.J., Johnson, A.T.C., Ouerghi, A. "Bandgap inhomogeneity of MoS2 monolayers on epitaxial graphene bilayers in van der Waals p-n junctions" Carbon., 110: ...
La place de la physicochimie en urologie et en néphrologie : le bilan de 10 ans de collaboration entre physiciens, chimistes et praticiens hospitaliers
Publié le 10/11/2016
... Bazin, D., Letavernier, E., Haymann, J.P., Méria, P., Daudon, M. "La place de la physicochimie en urologie et en néphrologie : le bilan de 10 ans de collaboration entre physiciens, chimistes et praticiens hospitaliers" Progrès en Urologie., 26(11-12): ...
Observation of an eg-derived Metallic Band at the Cs/SrTiO3 Interface by Polarization-dependent Photoemission Spectroscopy
Publié le 10/11/2016
... Akikubo, K., Matsuda, I., Schmaus, D., Marcaud, G., Liu, R.Y., Silly, M.G., Sirotti, F., D'Angelo, M. "Observation of an eg-derived Metallic Band at the Cs/SrTiO3 Interface by Polarization-dependent Photoemission Spectroscopy" Thin Solid Films., 603: 149 ...
Artifact characterization and reduction in scanning X-ray Zernike phase contrast microscopy
Publié le 10/11/2016
... Vartiainen, I., Holzner, C., Mohacsi, I., Karvinen, P., Diaz, A., Pigino, G., David, C. "Artifact characterization and reduction in scanning X-ray Zernike phase contrast microscopy" Optics Express., 23(10): 13278-13293. (2015). ...
Cation Depth Distribution at Alkali Halide Solution Surfaces
Publié le 10/11/2016
... Tissot, H., Olivieri, G., Gallet, J.J., Bournel, F., Silly, M.G., Sirotti, F., Rochet, F. "Cation Depth Distribution at Alkali Halide Solution Surfaces" Journal of Physical Chemistry C., 119(17): 9253-9259. (2015). ...
Chemically-specific time-resolved surface photovoltage spectroscopy: Carrier dynamics at the interface of quantum dots attached to a metal oxide
Publié le 10/11/2016
... Spencer, B.F., Cliffe, M.J., Graham, D.M., Hardman, S.J.O., Seddon, E.A., Syres, K.L., Thomas, A.G., Sirotti, F., Silly, M.G., Akhtar, J., O’Brien, P., Fairclough, S.M., Smith, J.M., Chattopadhyay, S., Flavell, W.R. "Chemically-specific time-resolved ...
Possibilities and Challenges of Scanning Hard X-ray Spectro-microscopy Techniques in Material Sciences
Publié le 10/11/2016
... Somogyi, A., Mocuta, C. "Possibilities and Challenges of Scanning Hard X-ray Spectro-microscopy Techniques in Material Sciences" AIMS Materials Science., 2(2): 122-162. (2015). ...
Optical design and multi-length-scale scanning spectro-microscopy possibilities at the Nanoscopium beamline of Synchrotron Soleil
Publié le 10/11/2016
... Somogyi, A., Medjoubi, K., Baranton, G., Le Roux, V., Ribbens, M., Polack, F., Philippot, P., Samama, J.P. "Optical design and multi-length-scale scanning spectro-microscopy possibilities at the Nanoscopium beamline of Synchrotron Soleil" Journal of ...
The electronic properties of mixed valence hydrated europium chloride thin film
Publié le 10/11/2016
... Silly, M.G., Charra, F., Lux, F., Lemercier, G., Sirotti, F. "The electronic properties of mixed valence hydrated europium chloride thin film" PCCP - Physical Chemistry Chemical Physics., 17(28): 18403-18412. (2015). ...
Atomically Sharp Interface in an h-BN-epitaxial graphene van der Waals Heterostructure
Publié le 10/11/2016
... Sediri, H., Pierucci, D., Hajlaoui, M., Henck, H., Patriarche, G., Dappe, Y.J., Yuan, S., Toury, B., Belkhou, R., Silly, M.G., Sirotti, F., Boutchich, M., Ouerghi, A. "Atomically Sharp Interface in an h-BN-epitaxial graphene van der Waals Heterostructure" ...