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Développement de la métrologie des photons X avec des sources monochromatiques accordables
Publié le 10/11/2016
... Lépy, M.C., Ménesguen, Y. "Développement de la métrologie des photons X avec des sources monochromatiques accordables" Revue française de métrologie., 37(1): 13-20. (2015). ...
Performance of Laser Megajoule’s x-ray streak camera
Publié le 10/11/2016
... Zuber, C., Bazzoli, S., Brunel, P., Burillo, M., Fronty, J.P., Gontier, D., Goulmy, C., Moreau, I., Oudot, G., Rubbelynck, C., Soullié, G., Stemmler, P., Trosseille, C. "Performance of Laser Megajoule’s x-ray streak camera" Review of Scientific ...
Overview of the ARGOS X-ray framing camera for Laser MegaJoule
Publié le 10/11/2016
... Trosseille, C., Aubert, D., Auger, L., Bazzoli, S., Beck, T., Brunel, P., Burillo, M., Chollet, C., Gazave, J., Jasmin, S., Maruenda, P., Moreau, I., Oudot, G., Raimbourg, J., Soullié, G., Stemmler, P., Zuber, C. "Overview of the ARGOS X-ray framing ...
Approaches for theoretical and experimental determinations of K -shell decay rates and fluorescence yields in Ge
Publié le 10/11/2016
... Sampaio, J.M., Madeira, T.I., Marques, J.P., Parente, F., Costa, A.M., Indelicato, P., Santos, J.P., Lépy, M.C., Ménesguen, Y. "Approaches for theoretical and experimental determinations of K -shell decay rates and fluorescence yields in Ge" Physical ...
Un réseau à revêtement multicouche alterné présentant des efficacités de diffraction élevées pour les rayons X tendres
Publié le 10/11/2016
... Polack, F. "Un réseau à revêtement multicouche alterné présentant des efficacités de diffraction élevées pour les rayons X tendres" Photoniques., 72: 34-35. (2014). ...
High-efficiency zone-plate optics for multi-keV X-ray focusing
Publié le 10/11/2016
... Mohacsi, I., Karvinen, P., Vartiainen, I., Guzenko, V.A., Somogyi, A., Kewish, C.M., Mercere, P., David, C. "High-efficiency zone-plate optics for multi-keV X-ray focusing" Journal of Synchrotron Radiation., 21(3): 497-501. (2014). ...
Ex- and In-situ Metrology Based on the Shack-Hartmann Technique for Sub-nanometric Metrology
Publié le 10/11/2016
... Idir, M., Dovillaire, G., Mercere, P. "Ex- and In-situ Metrology Based on the Shack-Hartmann Technique for Sub-nanometric Metrology" Synchrotron Radiation News., 26(5): 23-29. (2013). ...
Spectral filtering optimization of a measuring channel of an X-ray broadband spectrometer
Publié le 10/11/2016
... Emprin, B., Troussel, P., Villette, B., Delmotte, F., Proceedings of SPIE "Spectral filtering optimization of a measuring channel of an X-ray broadband spectrometer" Paper presented at the Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: ...
Preparation for B4C/Mo2C multilayer deposition of alternate multilayer gratings with high efficiency in the 0.5-2.5 keV energy range
Publié le 10/11/2016
... Choueikani, F., Delmotte, F., Bridou, F., Lagarde, B., Mercere, P., Otero, E., Ohresser, P., Polack, F. "Preparation for B4C/Mo2C multilayer deposition of alternate multilayer gratings with high efficiency in the 0.5-2.5 keV energy range" Journal of ...
X-ray properties and interface study of B4C/Mo and B4C/Mo2C periodic multilayers
Publié le 10/11/2016
... Choueikani, F., Bridou, F., Lagarde, B., Meltchakov, E., Polack, F., Mercere, P., Delmotte, F. "X-ray properties and interface study of B4C/Mo and B4C/Mo2C periodic multilayers" Applied Physics A: Materials Science & Processing., 111(1): 191-198. (2013). ...