RECHERCHER

... Idir, M., Mercère, P., Moreno, T., Delmotte, A., Jae-Young Choi & Seungyu Rah "Metrology and Tests Beamline at SOLEIL" Paper presented at the Ninth International Conference on Synchrotron Radiation Instrumentation 28 May-2 June 2006. Jae-Young Choi & ...

... Idir, M., Mercère, P., Moreno, T., Delmotte, A. "Metrology and test beamline at SOLEIL" Synchrotron Radiation News., 19(4): 18-23. (2006). ...

... Idir, M., Brochet, S., Delmotte, A., Lagarde, B., Mercère, P., Moreno, T., Polack, F., Thomasset, M. "Le pôle de métrologie de SOLEIL." Journal de Physique IV., 138: 265-274. (2006). ...

... Hecquet, C., Roulliay, M., Delmotte, F., Ravet-Krill, M. F., Hardouin, A., Idir, M., Zeitoun, P. "EUV large spectrum reflectometry for the metrology of optics" Journal de physique IV., 138: 259-264. (2006). ...

... Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Brochet, S., Polack, F., Idir, M., Mercère, P., Moreno, T. "Shack-Hartmann long trace profiler : A new generation of 2D LTP" Synchrotron Radiation News., 19(4): 24-27. (2006). ...

... Flank, A.M., Cauchon, G., Lagarde, P., Bac, S., Janousch, M., Wetter, R., Dubuisson, J.M., Idir, M., Langlois, F., Moreno, T., Vantelon, D. "LUCIA, a microfocus soft XAS beamline" Nuclear Instruments and Methods B., 246(1): 269-274. (2006). ...

... Desjardins, K., Hustache, S., Polack, F., Moreno, T., Idir, M., Dubuisson, J.M., Daguerre, J.P., Giorgetta, J.L., Thoraud, S., Delmotte, F., Ravet-Krill, M. F., Jae-Young Choi & Seungyu Rah, "The DiagOn : an Undulator Diagnostic for SOLEIL Low Energy ...

... Rommeveaux, A., Thomasset, M., Cocco, D., Siewert, F., SPIE "First report on a European Round Robin for slope measuring profilers" Paper presented at the Advances in metrology for x-ray and EUV optics. 5921: 59210I.1-59210I.12. (2005). ...

... Moreno, T., Belkhou, R., Cauchon, G., Idir, M., Assoufid L. Takacs P.Z. Taylor J.S., SPIE "New optical setup for the generation of variable spot size on third generation synchrotron beamlines" Paper presented at the Advances in metrology for x-ray and EUV ...

... Mercère, P., Bucourt, S., Cauchon, G., Douillet, D., Dovillaire, G., Goldberg, K.A., Idir, M., Levecq, X., Moreno, T., Naulleau, P.P., Rekawa, S., Zeitoun, P., Assoufid L., Takacs P.Z., Taylor J.S. "X-ray beam metrology and X-ray optic alignment by ...