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Résultats de la recherche ""
Simultaneous fast scanning XRF, dark field, phase-, and absorption contrast tomography
Publié le 10/11/2016
... Medjoubi, K., Bonissent, A., Leclercq, N., Langlois, F., Mercere, P., Somogyi, A., Barry Lai "Simultaneous fast scanning XRF, dark field, phase-, and absorption contrast tomography" Paper presented at the X-Ray Nanoimaging: Instruments and Methods, San ...
High efficiency multilayer gratings for monochromators in the energy range from 500 eV to 2500 eV
Publié le 10/11/2016
... Lagarde, B., Choueikani, F., Capitanio, B., Ohresser, P., Meltchakov, E., Delmotte, F., Krumrey, M., Polack, F. "High efficiency multilayer gratings for monochromators in the energy range from 500 eV to 2500 eV" Journal of Physics Conferences Series., 425 ...
Design and Fabrication of a 1 THz Backward Wave Amplifier
Publié le 10/11/2016
... Paoloni, C., Di Carlo, A., Brunetti, F., Mineo, M., Ulisse, G., Durand, A.J., Krozer, V., Kotiranta, M., Fiorello, A.M., Dispenza, M., Secchi, A., Zhurbenko, V., Bouamrane, F., Bouvet, T., Megtert, S., Tamburri, E., Cojocaru, C.S., Gohier, A. "Design and ...
Study of Micro Roughness Parameters and Growth Characteristics of NbC/Si Multilayer using Layer by Layer Power Spectral Density Analysis
Publié le 10/11/2016
... Modi, M.H., Lodha, G.S., Thomasset, M., Idir, M., Alka B. Garg, R. Mittal, R. Mukhopadhyay "Study of Micro Roughness Parameters and Growth Characteristics of NbC/Si Multilayer using Layer by Layer Power Spectral Density Analysis" Paper presented at the ...
Characterization of the Metrology beamline at the SOLEIL synchrotron and application to the determination of mass attenuation coefficients of Ag and Sn in the range 3.5
Publié le 10/11/2016
... Ménesguen,, Lépy, M.C. "Characterization of the Metrology beamline at the SOLEIL synchrotron and application to the determination of mass attenuation coefficients of Ag and Sn in the range 3.5<E<28keV" X-Ray Spectrometry., 40(6): 411-416. (2011). ...
Germanium-Based Circular Zone Plates for Soft and Hard X-Rays
Publié le 10/11/2016
... Firsov, A., Belkhou, R., Idir, M., Svintsov, A., Zaitsev, S., Ferlazzo, L., Cambril, E., AIP Conference Proceedings "Germanium-Based Circular Zone Plates for Soft and Hard X-Rays" Paper presented at the The 10th International Conference on X-ray ...
Étude des multicouches B4C/Mo pour la réalisation des réseaux multicouches alternés à efficacité élevée dans le domaine 1–5 KeV
Publié le 10/11/2016
... Choueikani, F., Delmotte, F., Polack, F., Bridou, F., Lagarde, B., Idir, M., A. Calisti, C. Mossé et S. Ferri "Étude des multicouches B4C/Mo pour la réalisation des réseaux multicouches alternés à efficacité élevée dans le domaine 1–5 KeV" In UVX 2010 - ...
Wavefront Analysis of Nonlinear Self-Amplified Spontaneous-Emission Free-Electron Laser Harmonics in the Single-Shot Regime
Publié le 10/11/2016
... Bachelard, R., Mercère, P., Idir, M., Couprie, M. E., Labat, M., Chubar, O., Lambert, G., Zeitoun, P., Kimura, H., Ohashi, H., Higashiya, A., Yabashi, M., Nagasono, M., Hara, T., Ishikawa, T "Wavefront Analysis of Nonlinear Self-Amplified Spontaneous ...
In-situ metrology for the optimization of bent crystals used in hard-X-ray monochromators: Comparison between measurement and simulation
Publié le 10/11/2016
... Thomasset, M., Moreno, T., Capitanio, B., Idir, M., Bucourt, S. "In-situ metrology for the optimization of bent crystals used in hard-X-ray monochromators: Comparison between measurement and simulation" Nuclear Instruments and Methods A., 616(2-3): 197 ...
Performances of AlGaN-based focal plane arrays from 10nm to 200nm
Publié le 10/11/2016
... Reverchon, J.L., Bansropun, S., Truffer, J.P., Costard, E., Frayssinet, E., Brault, J., Duboz, J.Y., Giuliani, A., Idir, M. "Performances of AlGaN-based focal plane arrays from 10nm to 200nm" Paper presented at the Space Missions and Technologies, 5 ...