RECHERCHER
Résultats de la recherche ""
High-efficiency B4C/Mo2C alternate multilayer grating for monochromators in the photon energy range from 0.7 to 3.4 keV
Publié le 10/11/2016
... Choueikani, F., Lagarde, B., Delmotte, F., Krumrey, M., Bridou, F., Thomasset, M., Meltchakov, E., Polack, F. "High-efficiency B4C/Mo2C alternate multilayer grating for monochromators in the photon energy range from 0.7 to 3.4 keV" Optics Letters., 39(7): ...
Design and performance of AERHA, a high acceptance high resolution soft x-ray spectrometer
Publié le 10/11/2016
... Chiuzbaian, S. G., Hague, C.F., Avila, A., Delaunay, R., Jaouen, N., Sacchi, M., Polack, F., Thomasset, M., Lagarde, B., Nicolaou, A., Brignolo, S., Baumier, C., Lüning, J., Mariot, J.M. "Design and performance of AERHA, a high acceptance high resolution ...
Comparison of three types of XPAD3.2/CdTe single chip hybrids for hard X-ray applications in material science and biomedical imaging
Publié le 10/11/2016
... Buton, C., Dawiec, A., Graber-Bolis, J., Arnaud, K., Bérar, J.F., Blanc, N., Boudet, N., Clémens, J.C., Debarbieux, F., Delpierre, P., Dinkespiler, B., Gastaldi, T., Hustache, S., Pangaud, P., Perez-Ponce, H., Vigeolas, E. "Comparison of three types of ...
Two-dimensional resonant magnetic soft X-ray scattering set-up for extreme sample environment
Publié le 10/11/2016
... Stanescu, S., Mocuta, C., Merlet, F., Barbier, A. "Two-dimensional resonant magnetic soft X-ray scattering set-up for extreme sample environment" Journal of Synchrotron Radiation., 20(1): 181-189. (2013). ...
Energy resolution of the CdTe-XPAD detector: calibration and potential for Laue diffraction measurements on protein crystals
Publié le 10/11/2016
... Medjoubi, K., Thompson, A., Bérar, J.F., Clemens, J.C., Delpierre, P., Da Silva, P., Dinkespiler, B., Fourme, R., Gourhant, P., Guimaraes, B.G., Hustache, S., Idir, M., Itié, J.P., Legrand, P., Menneglier, C., Mercere, P., Picca, F., Samama, J.P., "Energy ...
Métrologie à SOLEIL : optique en rayons X
Publié le 10/11/2016
... Mercère, P. "Métrologie à SOLEIL : optique en rayons X" Photoniques., 72: 39-41. (2014). ...
Characterization of subnanometric layers by grazing incidence X-ray reflectometry
Publié le 10/11/2016
... Emprin, B., Troussel, P., Soullié, G., Stemmler, P., Mercère, P., Meltchakov, E., Jérôme, A., Delmotte, F. "Characterization of subnanometric layers by grazing incidence X-ray reflectometry" Thin Solid Films., 556: 54–60. (2014). ...
X-ray broadband Ni/SiC multilayers: improvement with W barrier layers
Publié le 10/11/2016
... Emprin, B., Troussel, P., Soullie, G., Stemmler, P., Mercere, P., Meltchakov, E., Jerome, A., Delmotte, F. "X-ray broadband Ni/SiC multilayers: improvement with W barrier layers" Optics Express., 22(21): 25853-25865. (2014). ...
MTF, NPS and DQE characterization of an in-house developed X-ray imaging detector for synchrotron based micro-tomography
Publié le 10/11/2016
... Desjardins, K., Bordessoule, M., Petrache, C., Menneglier, C., Dallé, D., Mercere, P., Medjoubi, K. "MTF, NPS and DQE characterization of an in-house developed X-ray imaging detector for synchrotron based micro-tomography" Journal of Instrumentation., 9: ...
X-ray grating spectrometer for opacity measurements in the 50 eV to 250 eV spectral range at the LULI 2000 laser facility
Publié le 10/11/2016
... Reverdin, C., Thais, F., Loisel, G., Busquet, M., Bastiani-Ceccotti, S., Blenski, T., Caillaud, T., Ducret, J.E., Foelsner, W., Gilles, D., Gilleron, F., Pain, J.C., Poirier, M., Serres, F., Silvert, V., Soullie, G., Turck-Chieze, S., Villette, B. "X-ray ...