RECHERCHER

... Choueikani, F., Lagarde, B., Delmotte, F., Krumrey, M., Bridou, F., Thomasset, M., Meltchakov, E., Polack, F. "High-efficiency B4C/Mo2C alternate multilayer grating for monochromators in the photon energy range from 0.7 to 3.4 keV" Optics Letters., 39(7): ...

... Chiuzbaian, S. G., Hague, C.F., Avila, A., Delaunay, R., Jaouen, N., Sacchi, M., Polack, F., Thomasset, M., Lagarde, B., Nicolaou, A., Brignolo, S., Baumier, C., Lüning, J., Mariot, J.M. "Design and performance of AERHA, a high acceptance high resolution ...

... Lagarde, B., Choueikani, F., Capitanio, B., Ohresser, P., Meltchakov, E., Delmotte, F., Krumrey, M., Polack, F. "High efficiency multilayer gratings for monochromators in the energy range from 500 eV to 2500 eV" Journal of Physics Conferences Series., 425 ...

... Modi, M.H., Lodha, G.S., Thomasset, M., Idir, M., Alka B. Garg, R. Mittal, R. Mukhopadhyay "Study of Micro Roughness Parameters and Growth Characteristics of NbC/Si Multilayer using Layer by Layer Power Spectral Density Analysis" Paper presented at the ...

... Choueikani, F., Delmotte, F., Polack, F., Bridou, F., Lagarde, B., Idir, M., A. Calisti, C. Mossé et S. Ferri "Étude des multicouches B4C/Mo pour la réalisation des réseaux multicouches alternés à efficacité élevée dans le domaine 1–5 KeV" In UVX 2010 - ...

... Thomasset, M., Moreno, T., Capitanio, B., Idir, M., Bucourt, S. "In-situ metrology for the optimization of bent crystals used in hard-X-ray monochromators: Comparison between measurement and simulation" Nuclear Instruments and Methods A., 616(2-3): 197 ...

... Idir, M., Mercère, P., Moreno, T., Delmotte, A., Da Silva, P., Modi, M.H. "Metrology and Tests beamline at SOLEIL Design and first results" Paper presented at the SRI 2009, 10th International Conference on Synchrotron Radiation Instrumentation, Melbourne, ...

... Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Polack, F., Idir, M., Mercère, P., Moreno, T., Brochet, S. "A Shack-Hartmann measuring head for the two-dimensional characterization of X-ray mirrors" Journal of Synchrotron Radiation., 15(2): 134-139. ...

... Modi, M.H., Rai, S.K., Thomasset, M., Lodha, G.S., Idir, M. "Effect of surface roughness on multilayer film growth" European Physical Journal.-Special Topics., 167(1): 27-32. (2009). ...

... Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Polack, F., Idir, M., Mercère, P., Brochet, S., Moreno, T., Wolfgang Osten, Christophe Gorecki, Erik L. Novak "Surface metrology with a stitching Shack-Hartmann profilometric head" Paper presented at ...