RECHERCHER

... Mercère, P., Idir, M., Floriot, J., Levecq, X. "Hartmann and Shack–Hartmann Wavefront Sensors for Sub-nanometric Metrology" In Modern Developments in X-Ray and Neutron Optics: 219-232: Springer-Verlag, 2008. ISBN: 978-3-540-74560-0 ...

... Idir, M., Mercère, P., Modi, M.H., Dovillaire, G., Levecq, X., Bucourt, S., Escolano, L., Sauvageot, P. "X-ray active mirror coupled with a Hartmann wavefront analyser" Paper presented at the Workshop on X-ray and XUV Active Optics 2nd, 9-11 October 2008. ...

... Gautier, J., Zeitoun, P., Hauri, C., Morlens, A.S., Rey, G., Valentin, C., Papalarazou, E., Goddet, J.P., Sebban, S., Burgy, F., Mercère, P., Idir, M., Dovillaire, G., Levecq, X., Bucourt, S., Fajardo, M., Merdji, H., Caumes, J.P. "Optimization of the ...

... Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Polack, F., Idir, M., Mercère, P., Moreno, T., Brochet, S. "A Shack-Hartmann measuring head for the two-dimensional characterization of X-ray mirrors" Journal of Synchrotron Radiation., 15(2): 134-139. ...

... Couprie, M. E., Loulergue, A., Benabderrahmane, C., Chubar, O., Denard, J. C., Filhol, J.M., Idir, M., Labat, M., Lestrade, A., Louvet, M., Marchand, P., Marcouillé, O., Mercère, P., Nadolski, L., Nahon, L., Dumas, P., Morin, P., Bruni, C., Lambert, G., ...

... Reverchon, J.L., Robo, J.A., Truffer, J.P., Caumes, J.P., Idir, M., Brault, J., Duboz, J.Y. "AlGaN-based focal plane arrays for selective UV imaging at 310nm and 280nm and route toward deep UV imaging". Paper presented at the Sensors, Systems, and Next ...

... Reverchon, J.L., Bansropun, S., Robo, J.A., Truffer, J.P., Costard, E., Frayssinet, E., Brault, J., Semond, F., Duboz, J.Y., Idir, M. "First demonstration and performances of AlGaN based focal plane array for deep-UV imaging" Proceedings of SPIE., 7474: ...

... Nagler, B., Zastrau, U., Fäustlin, R.R., Vinko, S.M., Whitcher, T., Nelson, A.J., Sobierajski, R., Krzywinski, J., Chalupsky, J., Abreu, E., Bajt, S., Bornath, T., Burian, T., Chapman, H., Cihelka, J., Döppner, T., Düsterer, S., Dzelzainis, T., Fajardo, M ...

... Modi, M.H., Rai, S.K., Thomasset, M., Lodha, G.S., Idir, M. "Effect of surface roughness on multilayer film growth" European Physical Journal.-Special Topics., 167(1): 27-32. (2009). ...

... Modi, M.H., Mercère, P., Idir, M. "High precision surface metrology using a phase retrieval method" Journal of Physics Conferences Series., 186: art.n° 012068. (2009). ...