RECHERCHER

... Emprin, B., Troussel, P., Villette, B., Delmotte, F., Proceedings of SPIE "Spectral filtering optimization of a measuring channel of an X-ray broadband spectrometer" Paper presented at the Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: ...

... Choueikani, F., Delmotte, F., Bridou, F., Lagarde, B., Mercere, P., Otero, E., Ohresser, P., Polack, F. "Preparation for B4C/Mo2C multilayer deposition of alternate multilayer gratings with high efficiency in the 0.5-2.5 keV energy range" Journal of ...

... Choueikani, F., Bridou, F., Lagarde, B., Meltchakov, E., Polack, F., Mercere, P., Delmotte, F. "X-ray properties and interface study of B4C/Mo and B4C/Mo2C periodic multilayers" Applied Physics A: Materials Science & Processing., 111(1): 191-198. (2013). ...

... Choueikani, F., Lagarde, B., Delmotte, F., Krumrey, M., Bridou, F., Thomasset, M., Meltchakov, E., Polack, F. "High-efficiency B4C/Mo2C alternate multilayer grating for monochromators in the photon energy range from 0.7 to 3.4 keV" Optics Letters., 39(7): ...

... Chiuzbaian, S. G., Hague, C.F., Avila, A., Delaunay, R., Jaouen, N., Sacchi, M., Polack, F., Thomasset, M., Lagarde, B., Nicolaou, A., Brignolo, S., Baumier, C., Lüning, J., Mariot, J.M. "Design and performance of AERHA, a high acceptance high resolution ...

... Buton, C., Dawiec, A., Graber-Bolis, J., Arnaud, K., Bérar, J.F., Blanc, N., Boudet, N., Clémens, J.C., Debarbieux, F., Delpierre, P., Dinkespiler, B., Gastaldi, T., Hustache, S., Pangaud, P., Perez-Ponce, H., Vigeolas, E. "Comparison of three types of ...

... Stanescu, S., Mocuta, C., Merlet, F., Barbier, A. "Two-dimensional resonant magnetic soft X-ray scattering set-up for extreme sample environment" Journal of Synchrotron Radiation., 20(1): 181-189. (2013). ...

... Medjoubi, K., Thompson, A., Bérar, J.F., Clemens, J.C., Delpierre, P., Da Silva, P., Dinkespiler, B., Fourme, R., Gourhant, P., Guimaraes, B.G., Hustache, S., Idir, M., Itié, J.P., Legrand, P., Menneglier, C., Mercere, P., Picca, F., Samama, J.P., "Energy ...

... Mercère, P. "Métrologie à SOLEIL : optique en rayons X" Photoniques., 72: 39-41. (2014). ...

... Emprin, B., Troussel, P., Soullié, G., Stemmler, P., Mercère, P., Meltchakov, E., Jérôme, A., Delmotte, F. "Characterization of subnanometric layers by grazing incidence X-ray reflectometry" Thin Solid Films., 556: 54–60. (2014). ...