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Orbital origin and matrix element effects in the Ag/Si(1 1 1)-(3x 3)R30 Fermi surface
Publié le 10/11/2016
... Perez-Dieste, V., Sanchez-Royo, J.F., Avila, J., Izquierdo, M., Roca, L., Tejeda, A., Asensio, M.C. "Orbital origin and matrix element effects in the Ag/Si(1 1 1)-(<root>3x <root>3)R30<degrees> Fermi surface" Surface Science., 601(3): ...
First demonstration and performances of AlGaN based focal plane array for deep-UV imaging
Publié le 10/11/2016
... Reverchon, J.L., Bansropun, S., Robo, J.A., Truffer, J.P., Costard, E., Frayssinet, E., Brault, J., Semond, F., Duboz, J.Y., Idir, M. "First demonstration and performances of AlGaN based focal plane array for deep-UV imaging" Proceedings of SPIE., 7474: ...
Turning solid aluminium transparent by intense soft X-ray photoionization
Publié le 10/11/2016
... Nagler, B., Zastrau, U., Fäustlin, R.R., Vinko, S.M., Whitcher, T., Nelson, A.J., Sobierajski, R., Krzywinski, J., Chalupsky, J., Abreu, E., Bajt, S., Bornath, T., Burian, T., Chapman, H., Cihelka, J., Döppner, T., Düsterer, S., Dzelzainis, T., Fajardo, M ...
Effect of surface roughness on multilayer film growth
Publié le 10/11/2016
... Modi, M.H., Rai, S.K., Thomasset, M., Lodha, G.S., Idir, M. "Effect of surface roughness on multilayer film growth" European Physical Journal.-Special Topics., 167(1): 27-32. (2009). ...
High precision surface metrology using a phase retrieval method
Publié le 10/11/2016
... Modi, M.H., Mercère, P., Idir, M. "High precision surface metrology using a phase retrieval method" Journal of Physics Conferences Series., 186: art.n° 012068. (2009). ...
Spatial characterization of SASE-FEL of SCSS Test Accelerator
Publié le 10/11/2016
... Mercère, P., Bachelard, R., Couprie, M. E., Idir, M., Chubar, O., Gautier, J., Lambert, G., Zeitoun, P., Bucourt, S., Dovillaire, G., Levecq, X., Kimura, H., Ohashi, H., Hara, T., Higashiya, A., Ishikawa, T., Nagasono, M., Yabashi, M. "Spatial ...
Nitrogen 1s NEXAFS and XPS spectroscopy of NH3-saturated Si(001)-2×1: Theoretical predictions and experimental observations at 300 K
Publié le 10/11/2016
... Mathieu, C., Bai, X, Bournel, F., Gallet, J.J., Carniato, S., Rochet, F., Sirotti, F., Silly, M.G., Chauvet, C., Krizmancic, D., Hennies, F. "Nitrogen 1s NEXAFS and XPS spectroscopy of NH3-saturated Si(001)-2×1: Theoretical predictions and experimental ...
Perspective for high energy density studies on x-ray FELs
Publié le 10/11/2016
... Lee, R.W., Nagler, B., Zastrau, U., Fäustlin, R.R., Vinko, S.M., Whitcher, T., Sobierajski, R., Krzywinski, J., Juha, L., Nelson, A.J., Bajt, S., Budil, K., Cauble, R.C., Bornath, T., Burian, T., Chalupsky, J., Chapman, H., Cihelka, J., Döppner, T., ...
Synchrotron Radiation and Conventional X-ray source photoemission studies of ã-Al2O3 thin films grown on Si(111) and Si(001) substrates by molecular beam epitaxy
Publié le 10/11/2016
... El Kazzi, M., Merckling, C., Grenet, G., Saint-Girons, G., Silly, M.G., Sirotti, F., Hollinger, G. "Synchrotron Radiation and Conventional X-ray source photoemission studies of ã-Al2O3 thin films grown on Si(111) and Si(001) substrates by molecular beam ...
Understanding the origin of the shadow bands of Bi-based superconductors with angle resolved photoemission
Publié le 10/11/2016
... Izquierdo, M., Avila, J., Roca, L., Gu, G., Li, Z.Z., Raffy, H., Asensio, M.C. "Understanding the origin of the shadow bands of Bi-based superconductors with angle resolved photoemission" Physica C: Superconductivity., 460-462(2): 937-938. (2007). ...