RECHERCHER

... Modi, M.H., Idir, M. "Shape error analysis for reflective nano focusing optics" Paper presented at the SRI 2009, 10th International Conference on Synchrotron Radiation Instrumentation, Melbourne, Australia, 27 September - 2 October 2009. 1234: 681-684. ...

... Mercère, P., Idir, M., Dovillaire, G., Levecq, X., Bucourt, S., Escolano, L., Sauvageot, P. "Hartmann wavefront sensor and adaptive x-ray optics developments for synchrotron applications" Paper presented at the Adaptive X-Ray Optics, San Diego, California ...

... Idir, M., Potier, J., Fricker, S., Snigirev, A., Snigireva, I., Modi, M.H. "X-ray Phase Contrast analysis—Digital wavefront development" Paper presented at the SRI 2009, 10th International Conference on Synchrotron Radiation Instrumentation, Melbourne, ...

... Idir, M., Mercère, P., Moreno, T., Delmotte, A., Da Silva, P., Modi, M.H. "Metrology and Tests beamline at SOLEIL Design and first results" Paper presented at the SRI 2009, 10th International Conference on Synchrotron Radiation Instrumentation, Melbourne, ...

... Idir, M., Mercère, P., Modi, M.H., Dovillaire, G., Levecq, X., Bucourt, S., Escolano, L., Sauvageot, P. "X-ray active mirror coupled with a Hartmann Wavefront Sensor" Nuclear Instruments and Methods A., 616(2-3): 162-171. (2010). ...

... Idir, M., Fricker, S., Modi, M.H., Potier, J. "X-ray digital wavefront sensor development" Nuclear Instruments and Methods A., 616(2-3): 255-260. (2010). ...

... Huang, K., Demadrille, R., Silly, M.G., Sirotti, F., Reiss, P., Renault, O. "Internal Structure of InP/ZnS Nanocrystals Unraveled by High-Resolution Soft X-ray Photoelectron Spectroscopy" ACS Nano., 4(8): 4799-4805. (2010). ...

... Gallet, J.J., Bournel, F., Pierucci, D., Bonato, M., Khaliq, A., Rochet, F., Silly, M.G., Sirotti, F. "A Synchrotron Radiation X-ray Photoemission Spectroscopy Study of n-Propyltriethoxysilane Adsorption on Si(001)-2 × 1 at Room Temperature" Journal of ...

... El Kazzi, M., Merckling, C., Saint-Girons, G., Grenet, G., Silly, M.G., Sirotti, F., Hollinger, G. "High oxidation state at the epitaxial interface of y-Al2O3 thin films grown on Si(111) and Si(001)" Applied Physics Letters., 97(15): art.n° 151902. (2010 ...

... Duboz, J.Y., Frayssinet, E., Chenot, S., Reverchon, J.L., Idir, M. "X-ray detectors based on GaN Schottky diodes" Applied Physics Letters., 97(16): art.n° 163504. (2010). ...