RECHERCHER

... Marchiori, C., El Kazzi, M., Czornomaz, L., Pierucci, D., Silly, M.G., Sirotti, F., Abel, S., Uccelli, E., Sousa, M., Fompeyrine, J. "Nanoscale physics and defect state chemistry at amorphous-Si/In0.53Ga0.47As interfaces" Journal of Physics D : Applied ...

... Lalmi, B., Girard, J.C., Pallecchi, E., Silly, M.G., David, C., Latil, S., Sirotti, F., Ouerghi, A. "Flower-Shaped Domains and Wrinkles in Trilayer Epitaxial Graphene on Silicon Carbide" Scientific Reports., 4: art.n° 4066. (2014). ...

... Khaliq, A., Gallet, J.J., Bournel, F., Pierucci, D., Tissot, H., Silly, M.G., Sirotti, F., Rochet, F. "Charge Transfer and Energy Level Alignment at the Interface between Cyclopentene-Modified Si(001) and Tetracyanoquinodimethane" Journal of Physical ...

... Jia, J., Bendounan, A., Chaouchi, K., Kubsky, S., Sirotti, F., Pasquali, L., Esaulov, V.A. "Chalcogen Atom Interaction with Palladium and the Complex Molecule-Metal Interface in Thiol Self Assembly" Journal of Physical Chemistry C., 118(43): 24983–24994. ...

... Jia, J., Bendounan, A., Chaouchi, K., Esaulov, V.A. "Sulfur Interaction with Cu(100) and Cu(111) Surfaces: a Photoemission Study" Journal of Physical Chemistry C., 118(42): 24583–24590. (2014). ...

... Hikosaka, Y., Lablanquie, P., Penent, F., Nakano, H., Ito, K. "Multi-electron coincidence spectroscopy: double photoionization from molecular inner-shell orbitals" Journal of Physics Conferences Series., 488: art.n° 012012. (2014). ...

... Guzzo, M., Kas, J.J., Sponza, L., Giorgetti, C., Sottile, F., Pierucci, D., Silly, M.G., Sirotti, F., Rehr, J., Reining , L. "Multiple satellites in materials with complex plasmon spectra: From graphite to graphene" Physical Review B., 89(8): art.n° ...

... Gogneau, N., Ben Gouider Trabelsi, A., Silly, M.G., Ridene, M., Portail, M., Michon, A., Oueslati, M., Belkhou, R., Sirotti, F., Ouerghi, A. "Investigation of structural and electronic properties of epitaxial graphene on 3C–SiC(100)/Si(100) substrates" ...

... Emprin, B., Troussel, P., Soullié, G., Stemmler, P., Mercère, P., Meltchakov, E., Jérôme, A., Delmotte, F. "Characterization of subnanometric layers by grazing incidence X-ray reflectometry" Thin Solid Films., 556: 54–60. (2014). ...

... Emprin, B., Troussel, P., Soullie, G., Stemmler, P., Mercere, P., Meltchakov, E., Jerome, A., Delmotte, F. "X-ray broadband Ni/SiC multilayers: improvement with W barrier layers" Optics Express., 22(21): 25853-25865. (2014). ...