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Upgrade of the SPECIES beamline at the MAX IV Laboratory
Publié le 10/04/2021
... Kokkonen, E., Lopes da Silva, F., Mikkelã, M.H., Johansson, N., Huang, S.W., Lee, J.M., Andersson, M., Bartalesi, A., Reinecke, B.N., Handrup, K., Tarawneh, H., Sankari, R., Knudsen, J., Schnadt, J., Såthea, C., Urpelainena, S. "Upgrade of the SPECIES ...
In-Situ Nanotribological Properties of Ultrananocrystalline Diamond Films Investigated with Ambient Pressure Atomic Force Microscopy
Publié le 03/04/2021
... Kim, J.E., Choi, J.I.J., Kim,J., Mun, B.S., Kim, K.J., Park, J.Y. "In-Situ Nanotribological Properties of Ultrananocrystalline Diamond Films Investigated with Ambient Pressure Atomic Force Microscopy" Journal of Physical Chemistry C., 125(12): 6909–6915. ...
A microfluidic dosimetry cell to irradiate solutions with poorly penetrating radiations: a step towards online dosimetry for synchrotron beamlines
Publié le 03/04/2021
... Huart, L., Nicolas, C., Hervé du Penhoat, M.A., Guigner, J.M., Gosse, C., Palaudoux, J., Lefrançois, S., Mercere, P., Dasilva, P., Renault, J.P., Chevallard, C. "A microfluidic dosimetry cell to irradiate solutions with poorly penetrating radiations: a ...
Graphene growth on Ni(111) by CO exposure at near ambient pressure
Publié le 02/04/2021
... Davì, R., Carraro, G., Stojkovska, M., Smerieri, M., Savio, L., Lewandowski, M., Gallet, J.J.., Bournel, F., Rocca, M., Vattuone, L. "Graphene growth on Ni(111) by CO exposure at near ambient pressure" Chemical Physics Letters., 774: art.n° 138596. (2021 ...
Metrology of thin layer deposition with combined XRR-GIXRF analysis at SOLEIL
Publié le 25/02/2021
... Ménesguen, Y., Lépy, M.C. "Metrology of thin layer deposition with combined XRR-GIXRF analysis at SOLEIL". Proceedings of SPIE., 11611: art.n° 116110I. (2021). ...
Characterization and performance evaluation of the XSPA‐500k detector using synchrotron radiation
Publié le 12/02/2021
... Nakaye, Y., Sakumura, T., Sakuma, Y., Mikusu, S., Dawiec, A., Orsini, F., Grybos, P., Szczygiel, R., Maj, P., Ferrara, J.D., Taguchi, T. "Characterization and performance evaluation of the XSPA‐500k detector using synchrotron radiation" Journal of ...
EUV and Hard X-ray Hartmann Wavefront Sensing for Optical Metrology, Alignment and Phase Imaging
Publié le 30/01/2021
... de La Rochefoucauld, O., Dovillaire, G., Harms, F., Idir, M., Huang, L., Levecq, X., Piponnier, M., Zeitoun, P. "EUV and Hard X-ray Hartmann Wavefront Sensing for Optical Metrology, Alignment and Phase Imaging" Sensors., 21(3): art.n° 874. (2021). ...
Phase transition from Au–Te surface alloy towards tellurene-like monolayer
Publié le 02/12/2020
... Bouaziz, M., Zhang, W., Tong, Y., Oughaddou, H., Enriquez, H., Mlika, R., Korri-Youssoufi, H., Chen, Z., Xiong, H., Cheng, Y., Bendounan, A. "Phase transition from Au–Te surface alloy towards tellurene-like monolayer" 2D Materials., 8(1): art.n° 015029. ...
Adsorption of Se on Cu(1 0 0) and formation of two-dimensional copper selenide layer
Publié le 01/12/2020
... Tong, Y., Enriquez, H., Kubsky, S., Esaulov, V.A., Oughaddou, H., Bendounan, A. "Adsorption of Se on Cu(1 0 0) and formation of two-dimensional copper selenide layer" Materials Today: Proceedings., 39(3): 1170-1174. (2021). ...
SI traceable characterisation of nanomaterials by X-ray spectrometry
Publié le 26/11/2020
... Beckhoff, B. "SI traceable characterisation of nanomaterials by X-ray spectrometry" IOP Conf. Series: Materials Science and Engineering., 891: art.n° 012003. (2020). ...