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Résultats de la recherche ""
A Shack-Hartmann measuring head for the two-dimensional characterization of X-ray mirrors
Publié le 10/11/2016
... Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Polack, F., Idir, M., Mercère, P., Moreno, T., Brochet, S. "A Shack-Hartmann measuring head for the two-dimensional characterization of X-ray mirrors" Journal of Synchrotron Radiation., 15(2): 134-139. ...
The ARC-EN-CIEL fourth generation light source proposal
Publié le 10/11/2016
... Couprie, M. E., Loulergue, A., Benabderrahmane, C., Chubar, O., Denard, J. C., Filhol, J.M., Idir, M., Labat, M., Lestrade, A., Louvet, M., Marchand, P., Marcouillé, O., Mercère, P., Nadolski, L., Nahon, L., Dumas, P., Morin, P., Bruni, C., Lambert, G., ...
Ag organisation on Ni(111) surface
Publié le 10/11/2016
... Chambon, C., Coati, A., Garreau, Y. "Ag organisation on Ni(111) surface" Surface Science., 602(14): 2363-2367. (2008). ...
AlGaN-based focal plane arrays for selective UV imaging at 310nm and 280nm and route toward deep UV imaging
Publié le 10/11/2016
... Reverchon, J.L., Robo, J.A., Truffer, J.P., Caumes, J.P., Idir, M., Brault, J., Duboz, J.Y. "AlGaN-based focal plane arrays for selective UV imaging at 310nm and 280nm and route toward deep UV imaging". Paper presented at the Sensors, Systems, and Next ...
Direct observation of elastic displacement modes by grazing-incidence X-ray diffraction
Publié le 10/11/2016
... Prévot, G., Coati, A., Croset, B., Garreau, Y. "Direct observation of elastic displacement modes by grazing-incidence X-ray diffraction" Journal of Applied Crystallography., 40:(5): 874-882. (2007). ...
First demonstration and performances of AlGaN based focal plane array for deep-UV imaging
Publié le 10/11/2016
... Reverchon, J.L., Bansropun, S., Robo, J.A., Truffer, J.P., Costard, E., Frayssinet, E., Brault, J., Semond, F., Duboz, J.Y., Idir, M. "First demonstration and performances of AlGaN based focal plane array for deep-UV imaging" Proceedings of SPIE., 7474: ...
Turning solid aluminium transparent by intense soft X-ray photoionization
Publié le 10/11/2016
... Nagler, B., Zastrau, U., Fäustlin, R.R., Vinko, S.M., Whitcher, T., Nelson, A.J., Sobierajski, R., Krzywinski, J., Chalupsky, J., Abreu, E., Bajt, S., Bornath, T., Burian, T., Chapman, H., Cihelka, J., Döppner, T., Düsterer, S., Dzelzainis, T., Fajardo, M ...
Effect of surface roughness on multilayer film growth
Publié le 10/11/2016
... Modi, M.H., Rai, S.K., Thomasset, M., Lodha, G.S., Idir, M. "Effect of surface roughness on multilayer film growth" European Physical Journal.-Special Topics., 167(1): 27-32. (2009). ...
High precision surface metrology using a phase retrieval method
Publié le 10/11/2016
... Modi, M.H., Mercère, P., Idir, M. "High precision surface metrology using a phase retrieval method" Journal of Physics Conferences Series., 186: art.n° 012068. (2009). ...
Spatial characterization of SASE-FEL of SCSS Test Accelerator
Publié le 10/11/2016
... Mercère, P., Bachelard, R., Couprie, M. E., Idir, M., Chubar, O., Gautier, J., Lambert, G., Zeitoun, P., Bucourt, S., Dovillaire, G., Levecq, X., Kimura, H., Ohashi, H., Hara, T., Higashiya, A., Ishikawa, T., Nagasono, M., Yabashi, M. "Spatial ...