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Metrology of thin layer deposition with combined XRR-GIXRF analysis at SOLEIL
Publié le 25/02/2021
... Ménesguen, Y., Lépy, M.C. "Metrology of thin layer deposition with combined XRR-GIXRF analysis at SOLEIL". Proceedings of SPIE., 11611: art.n° 116110I. (2021). ...
Characterization and performance evaluation of the XSPA‐500k detector using synchrotron radiation
Publié le 12/02/2021
... Nakaye, Y., Sakumura, T., Sakuma, Y., Mikusu, S., Dawiec, A., Orsini, F., Grybos, P., Szczygiel, R., Maj, P., Ferrara, J.D., Taguchi, T. "Characterization and performance evaluation of the XSPA‐500k detector using synchrotron radiation" Journal of ...
EUV and Hard X-ray Hartmann Wavefront Sensing for Optical Metrology, Alignment and Phase Imaging
Publié le 30/01/2021
... de La Rochefoucauld, O., Dovillaire, G., Harms, F., Idir, M., Huang, L., Levecq, X., Piponnier, M., Zeitoun, P. "EUV and Hard X-ray Hartmann Wavefront Sensing for Optical Metrology, Alignment and Phase Imaging" Sensors., 21(3): art.n° 874. (2021). ...
Liveschaltung zum Dünnschichtwachstum
Publié le 15/12/2020
... Krause, B., Abadias, G. "Liveschaltung zum Dünnschichtwachstum" Vakuum in Forschung und Praxis ., 32(6): 26-31. (2020). ...
SI traceable characterisation of nanomaterials by X-ray spectrometry
Publié le 26/11/2020
... Beckhoff, B. "SI traceable characterisation of nanomaterials by X-ray spectrometry" IOP Conf. Series: Materials Science and Engineering., 891: art.n° 012003. (2020). ...
Modification of optical properties of magnesium oxide (MgO) thin film under the influence of ambienceModification of optical properties of magnesium oxide (MgO) thin film under the influence of ambience
Publié le 07/11/2020
... Sinha, M., Gupta, R.K., Da Silva, P., Mercere, P., Modi, M.H. "Modification of optical properties of magnesium oxide (MgO) thin film under the influence of ambienceModification of optical properties of magnesium oxide (MgO) thin film under the influence ...
Direct observation of the evolving metal–support interaction of individual cobalt nanoparticles at the titania and silica interface
Publié le 03/11/2020
... Qiu, C., Odarchenko, Y., Meng, Q., Cong, P., Schoen, M.A.W., Kleibert, A., Forrest, T., Beale, A.M. "Direct observation of the evolving metal–support interaction of individual cobalt nanoparticles at the titania and silica interface" Chemical Science., 11 ...
Surface mobility and impact of precursor dosing during atomic layer deposition of platinum: in situ monitoring of nucleation and island growth
Publié le 03/11/2020
... Dendooven, J., Van Daele, M., Solano, E., Ramachandran, R.K., Minjauw, M.M., Resta, A., Vlad, A., Garreau, Y., Coati, A., Portale, G., Detavernier, C. "Surface mobility and impact of precursor dosing during atomic layer deposition of platinum: in situ ...
Tuning size and coverage of Pd nanoparticles using Atomic Layer Deposition
Publié le 28/10/2020
... Feng, J.Y., Ramachandran, R.K., Solano, E., Minjauw, M.M., Van Daele, M., Vantomme, A., Hermida-Merino, D., Coati, A., Poelman, H., Detavernier, C., Dendooven, J. "Tuning size and coverage of Pd nanoparticles using Atomic Layer Deposition" Applied Surface ...
Backside‐illuminated scientific CMOS detector for soft X‐ray resonant scattering and ptychography
Publié le 28/10/2020
... Desjardins, K., Medjoubi, K., Sacchi, M., Popescu, H., Gaudemer, R., Belkhou, R., Stanescu, S., Swaraj, S., Besson, A., Vijayakumar, J., Pautard, S., Noureddine, A., Mercère, P., Da Silva, P., Orsini, F., Menneglier, C., Jaouen, N. "Backside‐illuminated ...