RECHERCHER

... Ciatto, G., Ciatto, G. (Ed). "Hydrogenated Dilute Nitride Semiconductors: Theory, Properties, and Applications" Pan Stanford, 2015. ISBN: 9789814463454 ...

... Ciatto, G., Claudia S. Schnohr and Mark C. Ridgway "Complexes and Clusters" In X-Ray Absorption Spectroscopy of Semiconductors: 99-125: Springer, 2015. ISBN: 978-3-662-44361-3 (P), 978-3-662-44362-0 (OL) ...

... Mercère, P. "Métrologie à SOLEIL : optique en rayons X" Photoniques., 72: 39-41. (2014). ...

... Fontaine, P., Fauré, M.C., Bardin, L., Filipe, E.J.M., Goldmann, M. "Evidence for Interaction with the Water Subphase As the Origin and Stabilization of Nano-Domain in Semi-Fluorinated Alkanes Monolayer at the Air/Water Interface" Langmuir., 30(50): ...

... Fontaine, P., Ciatto, G., Aubert, N., Goldmann, M. "Soft Interfaces and Resonant Investigation on Undulator Source: A Surface X-ray Scattering Beamline to Study Organic Molecular Films at the SOLEIL Synchrotron". Science of Advanced Materials., 6(11): ...

... Emprin, B., Troussel, P., Soullié, G., Stemmler, P., Mercère, P., Meltchakov, E., Jérôme, A., Delmotte, F. "Characterization of subnanometric layers by grazing incidence X-ray reflectometry" Thin Solid Films., 556: 54–60. (2014). ...

... Emprin, B., Troussel, P., Soullie, G., Stemmler, P., Mercere, P., Meltchakov, E., Jerome, A., Delmotte, F. "X-ray broadband Ni/SiC multilayers: improvement with W barrier layers" Optics Express., 22(21): 25853-25865. (2014). ...

... Desjardins, K., Bordessoule, M., Petrache, C., Menneglier, C., Dallé, D., Mercere, P., Medjoubi, K. "MTF, NPS and DQE characterization of an in-house developed X-ray imaging detector for synchrotron based micro-tomography" Journal of Instrumentation., 9: ...

... Reverdin, C., Thais, F., Loisel, G., Busquet, M., Bastiani-Ceccotti, S., Blenski, T., Caillaud, T., Ducret, J.E., Foelsner, W., Gilles, D., Gilleron, F., Pain, J.C., Poirier, M., Serres, F., Silvert, V., Soullie, G., Turck-Chieze, S., Villette, B. "X-ray ...

... Primot, J., Rizzi, J., Mercère, P., Idir, M., Bon, P., Wattellier, B., Druart, G., Vincent, G., Haïdar, R., Weitkamp, T., Guérineau, N., Monneret, S., Atsushi Momose, Wataru Yashiro "Multi-lateral shearing interferometry: Principle and application to X ...