RECHERCHER

... Bachelard, R., Mercère, P., Idir, M., Couprie, M. E., Labat, M., Chubar, O., Lambert, G., Zeitoun, P., Kimura, H., Ohashi, H., Higashiya, A., Yabashi, M., Nagasono, M., Hara, T., Ishikawa, T "Wavefront Analysis of Nonlinear Self-Amplified Spontaneous ...

... Vogel, J., Sacchi, M., Lamberto Duò, Marco Finazzi, Franco Ciccacci "Dichroism in X-ray Absorption for the Study of Antiferromagnetic Materials" In Magnetic Properties of Antiferromagnetic Oxide Materials: Surfaces, Interfaces, and Thin Films: 69-97: ...

... Vidal, F., Spezzani, C., Breitwieser, R., Marangolo, M., Eddrief, M., Sacchi, M., Etgens, V.H. "Tuning the period of elastic MnAs/GaAs(001) a-ß pattern by Fe deposition" Applied Physics Letters., 97(25): art.n° 251914. (2010). ...

... Tonnerre, J.M., Jaouen, N., Bontempi, E., Carbone, D., Babonneau, D., De Santis, M., Tolentino, H.C.N., Grenier, S., Garaudee, S., Staub, U. "Soft x-ray resonant magnetic reflectivity studies for in-and out-of-plane magnetization profile in ultra thin ...

... Thomasset, M., Moreno, T., Capitanio, B., Idir, M., Bucourt, S. "In-situ metrology for the optimization of bent crystals used in hard-X-ray monochromators: Comparison between measurement and simulation" Nuclear Instruments and Methods A., 616(2-3): 197 ...

... Swaraj, S., Wang, C., Yan, H., Watts,, Lüning, J., McNeill, C.R., Ade, H. "Nanomorphology of Bulk Heterojunction Photovoltaic Thin Films Probed with Resonant Soft X-ray Scattering" Nano Letters., 10(8): 2863-2869. (2010). ...

... Sacchi, M., Marangolo, M., Spezzani, C., Breitwieser, R., Popescu, H., Delaunay, R., Rache Salles, B, Eddrief, M., Etgens, V. H. "Thermal switching of the magnetization in an iron film on a magnetically active template MnAs/GaAs(001)" Physical Review B., ...

... Reverchon, J.L., Bansropun, S., Truffer, J.P., Costard, E., Frayssinet, E., Brault, J., Duboz, J.Y., Giuliani, A., Idir, M. "Performances of AlGaN-based focal plane arrays from 10nm to 200nm" Paper presented at the Space Missions and Technologies, 5 ...

... Modi, M.H., Idir, M. "Shape error analysis for reflective nano focusing optics" Paper presented at the SRI 2009, 10th International Conference on Synchrotron Radiation Instrumentation, Melbourne, Australia, 27 September - 2 October 2009. 1234: 681-684. ...

... Mercère, P., Idir, M., Dovillaire, G., Levecq, X., Bucourt, S., Escolano, L., Sauvageot, P. "Hartmann wavefront sensor and adaptive x-ray optics developments for synchrotron applications" Paper presented at the Adaptive X-Ray Optics, San Diego, California ...