RECHERCHER

... Montaux-Lambert, A., Mercère, P., Primot, J. "Interferogram conditioning for improved Fourier analysis and application to X-ray phase imaging by grating interferometry" Optics Express., 23(22): 28479-28490. (2015). ...

... Lépy, M.C., Ménesguen, Y. "Développement de la métrologie des photons X avec des sources monochromatiques accordables" Revue française de métrologie., 37(1): 13-20. (2015). ...

... Zuber, C., Bazzoli, S., Brunel, P., Burillo, M., Fronty, J.P., Gontier, D., Goulmy, C., Moreau, I., Oudot, G., Rubbelynck, C., Soullié, G., Stemmler, P., Trosseille, C. "Performance of Laser Megajoule’s x-ray streak camera" Review of Scientific ...

... Trosseille, C., Aubert, D., Auger, L., Bazzoli, S., Beck, T., Brunel, P., Burillo, M., Chollet, C., Gazave, J., Jasmin, S., Maruenda, P., Moreau, I., Oudot, G., Raimbourg, J., Soullié, G., Stemmler, P., Zuber, C. "Overview of the ARGOS X-ray framing ...

... Spezzani, C., Ferrari, E., Allaria, E., Vidal, F., Ciavardini, A., Delaunay, R., Capotondi, F., Pedersoli, E., Coreno, M., Svetina, C., Raimondi, L., Zangrando, D., Ivanov, R., Nikolov, I., Demidovich, A., Danailov, M.B., Popescu, H., Eddrief, M., De ...

... Sampaio, J.M., Madeira, T.I., Marques, J.P., Parente, F., Costa, A.M., Indelicato, P., Santos, J.P., Lépy, M.C., Ménesguen, Y. "Approaches for theoretical and experimental determinations of K -shell decay rates and fluorescence yields in Ge" Physical ...

... Polack, F. "Un réseau à revêtement multicouche alterné présentant des efficacités de diffraction élevées pour les rayons X tendres" Photoniques., 72: 34-35. (2014). ...

... Mohacsi, I., Karvinen, P., Vartiainen, I., Guzenko, V.A., Somogyi, A., Kewish, C.M., Mercere, P., David, C. "High-efficiency zone-plate optics for multi-keV X-ray focusing" Journal of Synchrotron Radiation., 21(3): 497-501. (2014). ...

... Jal, E., Dabrowski, M., Tonnerre, J.M., Przybylski, M., Grenier, S., Jaouen, N., Kirschner, J. "Magnetization profile across Au-covered bcc Fe films grown on a vicinal surface of Ag(001) as seen by x-ray resonant magnetic reflectivity" Physical Review B., ...

... Idir, M., Dovillaire, G., Mercere, P. "Ex- and In-situ Metrology Based on the Shack-Hartmann Technique for Sub-nanometric Metrology" Synchrotron Radiation News., 26(5): 23-29. (2013). ...