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Résultats de la recherche ""
X-ray photochemistry of Prussian blue cellulosic materials: Evidence for a substrate-mediated redox process
Publié le 10/11/2016
... Gervais, C., Languille, M.A., Moretti, G., Reguer, S. "X-ray photochemistry of Prussian blue cellulosic materials: Evidence for a substrate-mediated redox process" Langmuir., 31(29): 8168–8175. (2015). ...
Semiconductors Under Extreme Conditions
Publié le 10/11/2016
... Di Cicco, A., Filipponi, A., Claudia S. Schnohr and Mark C. Ridgway "Semiconductors Under Extreme Conditions" In X-Ray Absorption Spectroscopy of Semiconductors: 187-200: Springer, 2015. ISBN: 978-3-662-44361-3 (P), 978-3-662-44362-0 (OL) ...
Competition between two redox states in silicate melts: An in-situ experiment at the Fe K-edge and Eu L3-edge
Publié le 10/11/2016
... Cicconi, M.R., Neuville, D.R., Tannou, I., Baudelet, F., Floury, P., Paris, E., Giuli, G. "Competition between two redox states in silicate melts: An in-situ experiment at the Fe K-edge and Eu L3-edge" American Mineralogist., 100(4): 1013-1016. (2015). ...
Métrologie à SOLEIL : optique en rayons X
Publié le 10/11/2016
... Mercère, P. "Métrologie à SOLEIL : optique en rayons X" Photoniques., 72: 39-41. (2014). ...
Polythiophene coordination complexes as high performance lithium storage materials
Publié le 10/11/2016
... Mao, Y., Kong, Q., Shen, L., Wang, Z., Chen, L. "Polythiophene coordination complexes as high performance lithium storage materials" Journal of Power Sources., 248: 343-347. (2014). ...
Extended X-ray absorption fine structure studies of impulsive-type hardening in the heavily be-doped ZnSe ternaries
Publié le 10/11/2016
... Khan, S., Singh, P., Mazher, J. "Extended X-ray absorption fine structure studies of impulsive-type hardening in the heavily be-doped ZnSe ternaries" Journal of the Korean Physical Society., 64(4): 584-590. (2014). ...
Characterization of subnanometric layers by grazing incidence X-ray reflectometry
Publié le 10/11/2016
... Emprin, B., Troussel, P., Soullié, G., Stemmler, P., Mercère, P., Meltchakov, E., Jérôme, A., Delmotte, F. "Characterization of subnanometric layers by grazing incidence X-ray reflectometry" Thin Solid Films., 556: 54–60. (2014). ...
X-ray broadband Ni/SiC multilayers: improvement with W barrier layers
Publié le 10/11/2016
... Emprin, B., Troussel, P., Soullie, G., Stemmler, P., Mercere, P., Meltchakov, E., Jerome, A., Delmotte, F. "X-ray broadband Ni/SiC multilayers: improvement with W barrier layers" Optics Express., 22(21): 25853-25865. (2014). ...
MTF, NPS and DQE characterization of an in-house developed X-ray imaging detector for synchrotron based micro-tomography
Publié le 10/11/2016
... Desjardins, K., Bordessoule, M., Petrache, C., Menneglier, C., Dallé, D., Mercere, P., Medjoubi, K. "MTF, NPS and DQE characterization of an in-house developed X-ray imaging detector for synchrotron based micro-tomography" Journal of Instrumentation., 9: ...
Polyamorphism in cerium based bulk metallic glasses: Electronic and structural properties under pressure and temperature by x-ray absorption techniques
Publié le 10/11/2016
... Belhadi, L., Decremps, F., Pascarelli, S., Cormier, L., Le Godec, Y., Gorsse, S., Baudelet, F., Garbarino, G. "Polyamorphism in cerium based bulk metallic glasses: Electronic and structural properties under pressure and temperature by x-ray absorption ...