RECHERCHER
Résultats de la recherche ""
Étude des multicouches B4C/Mo pour la réalisation des réseaux multicouches alternés à efficacité élevée dans le domaine 1–5 KeV
Publié le 10/11/2016
... Choueikani, F., Delmotte, F., Polack, F., Bridou, F., Lagarde, B., Idir, M., A. Calisti, C. Mossé et S. Ferri "Étude des multicouches B4C/Mo pour la réalisation des réseaux multicouches alternés à efficacité élevée dans le domaine 1–5 KeV" In UVX 2010 - ...
Coherent x-ray diffraction imaging of paint pigment particles by scanning a phase plate modulator
Publié le 10/11/2016
... Chen, B., Zhang, F., Berenguer, F., Bean, R.J., Kewish, C.M., Vila-Comamala, J., Chu, Y.S., Rodenburg, J.M, Robinson, I.K. "Coherent x-ray diffraction imaging of paint pigment particles by scanning a phase plate modulator" New Journal of Physics., 13(10): ...
Wavefront Analysis of Nonlinear Self-Amplified Spontaneous-Emission Free-Electron Laser Harmonics in the Single-Shot Regime
Publié le 10/11/2016
... Bachelard, R., Mercère, P., Idir, M., Couprie, M. E., Labat, M., Chubar, O., Lambert, G., Zeitoun, P., Kimura, H., Ohashi, H., Higashiya, A., Yabashi, M., Nagasono, M., Hara, T., Ishikawa, T "Wavefront Analysis of Nonlinear Self-Amplified Spontaneous ...
In-situ metrology for the optimization of bent crystals used in hard-X-ray monochromators: Comparison between measurement and simulation
Publié le 10/11/2016
... Thomasset, M., Moreno, T., Capitanio, B., Idir, M., Bucourt, S. "In-situ metrology for the optimization of bent crystals used in hard-X-ray monochromators: Comparison between measurement and simulation" Nuclear Instruments and Methods A., 616(2-3): 197 ...
Nanoscopium: a Scanning Hard X-ray Nanoprobe Beamline at Synchrotron Soleil
Publié le 10/11/2016
... Somogyi, A., Polack, F., Moreno, T. "Nanoscopium: a Scanning Hard X-ray Nanoprobe Beamline at Synchrotron Soleil" Paper presented at the SRI 2009, 10th International Conference on Synchrotron Radiation Instrumentation, Melbourne, Australia, 27 September - ...
Performances of AlGaN-based focal plane arrays from 10nm to 200nm
Publié le 10/11/2016
... Reverchon, J.L., Bansropun, S., Truffer, J.P., Costard, E., Frayssinet, E., Brault, J., Duboz, J.Y., Giuliani, A., Idir, M. "Performances of AlGaN-based focal plane arrays from 10nm to 200nm" Paper presented at the Space Missions and Technologies, 5 ...
Shape error analysis for reflective nano focusing optics
Publié le 10/11/2016
... Modi, M.H., Idir, M. "Shape error analysis for reflective nano focusing optics" Paper presented at the SRI 2009, 10th International Conference on Synchrotron Radiation Instrumentation, Melbourne, Australia, 27 September - 2 October 2009. 1234: 681-684. ...
Hartmann wavefront sensor and adaptive x-ray optics developments for synchrotron applications
Publié le 10/11/2016
... Mercère, P., Idir, M., Dovillaire, G., Levecq, X., Bucourt, S., Escolano, L., Sauvageot, P. "Hartmann wavefront sensor and adaptive x-ray optics developments for synchrotron applications" Paper presented at the Adaptive X-Ray Optics, San Diego, California ...
Scanning transmission X-ray microscopy with a fast framing pixel detector
Publié le 10/11/2016
... Menzel, A., Kewish, C.M., Kraft, P., Henrich, B., Jefimovs, K., Vila-Comamala, J., David, C., Dierolf, M., Thibault, P., Pfeiffer, F., Bunk, O. "Scanning transmission X-ray microscopy with a fast framing pixel detector" Ultramicroscopy., 110(9): 1143 ...
Inversion domain boundaries in GaN studied by X-ray microprobe
Publié le 10/11/2016
... Martinez-Criado, G., Somogyi, A., Alén, B., Miskys, C., Tucoulou, R., Cloetens, P., Sans, J.A., Susini, J. "Inversion domain boundaries in GaN studied by X-ray microprobe" Physica Status Solidi - Rapid Research Letters., 4(1): 31-33. (2010). ...