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EUV large spectrum reflectometry for the metrology of optics
Publié le 10/11/2016
... Hecquet, C., Roulliay, M., Delmotte, F., Ravet-Krill, M. F., Hardouin, A., Idir, M., Zeitoun, P. "EUV large spectrum reflectometry for the metrology of optics" Journal de physique IV., 138: 259-264. (2006). ...
Shack-Hartmann long trace profiler : A new generation of 2D LTP
Publié le 10/11/2016
... Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Brochet, S., Polack, F., Idir, M., Mercère, P., Moreno, T. "Shack-Hartmann long trace profiler : A new generation of 2D LTP" Synchrotron Radiation News., 19(4): 24-27. (2006). ...
LUCIA, a microfocus soft XAS beamline
Publié le 10/11/2016
... Flank, A.M., Cauchon, G., Lagarde, P., Bac, S., Janousch, M., Wetter, R., Dubuisson, J.M., Idir, M., Langlois, F., Moreno, T., Vantelon, D. "LUCIA, a microfocus soft XAS beamline" Nuclear Instruments and Methods B., 246(1): 269-274. (2006). ...
The DiagOn : an Undulator Diagnostic for SOLEIL Low Energy Beamlines
Publié le 10/11/2016
... Desjardins, K., Hustache, S., Polack, F., Moreno, T., Idir, M., Dubuisson, J.M., Daguerre, J.P., Giorgetta, J.L., Thoraud, S., Delmotte, F., Ravet-Krill, M. F., Jae-Young Choi & Seungyu Rah, "The DiagOn : an Undulator Diagnostic for SOLEIL Low Energy ...
First report on a European Round Robin for slope measuring profilers
Publié le 10/11/2016
... Rommeveaux, A., Thomasset, M., Cocco, D., Siewert, F., SPIE "First report on a European Round Robin for slope measuring profilers" Paper presented at the Advances in metrology for x-ray and EUV optics. 5921: 59210I.1-59210I.12. (2005). ...
New optical setup for the generation of variable spot size on third generation synchrotron beamlines
Publié le 10/11/2016
... Moreno, T., Belkhou, R., Cauchon, G., Idir, M., Assoufid L. Takacs P.Z. Taylor J.S., SPIE "New optical setup for the generation of variable spot size on third generation synchrotron beamlines" Paper presented at the Advances in metrology for x-ray and EUV ...
X-ray beam metrology and X-ray optic alignment by Hartmann wavefront sensing
Publié le 10/11/2016
... Mercère, P., Bucourt, S., Cauchon, G., Douillet, D., Dovillaire, G., Goldberg, K.A., Idir, M., Levecq, X., Moreno, T., Naulleau, P.P., Rekawa, S., Zeitoun, P., Assoufid L., Takacs P.Z., Taylor J.S. "X-ray beam metrology and X-ray optic alignment by ...
Highly sensitive detection technique of buried defects in extreme ultraviolet masks using at-wavelength scanning dark-field microscopy
Publié le 10/11/2016
... Farys, V., Schiavone, P., Polack, F., Idir, M., Bertolo, M., Bianco, A., La-Rosa, S., Cautero, G., Vannuffel, C., Quesnel, E., Muffato, V. "Highly sensitive detection technique of buried defects in extreme ultraviolet masks using at-wavelength scanning ...
SAMBA a new beamline at SOLEIL for x-ray absorption spectroscopy in the 4-40 keV energy range
Publié le 10/11/2016
... Belin, S., Briois, V., Traverse, A., Idir, M., Moreno, T., Ribbens, M. "SAMBA a new beamline at SOLEIL for x-ray absorption spectroscopy in the 4-40 keV energy range" Physica Scripta T., 115: 980-983. (2005). ...
The new multi-technique beamline for radioactive matter at the synchrotron SOLEIL
Publié le 10/11/2016
... Sitaud, B., Lequien, S. "The new multi-technique beamline for radioactive matter at the synchrotron SOLEIL" Paper presented at the Third Workshop Speciation, Techniques and Facilities for Radioactive Materials at Synchrotron Light Sources, 14-16 September ...