RECHERCHER

... Khouchaf, L., Boinski, F., Tuilier, M.H., Flank, A.M. "Characterization of heterogeneous SiO2 materials by scanning electron microscope and micro fluorescence XAS techniques" Nuclear Instruments and Methods B., 252(2): 333-338. (2006). ...

... Itié, J.P., Flank, A.M., Lagarde, P., Polian, A., Couzinet, B., Idir, M., Jae-Young Choi & Seungyu Rah "Extension to Low Energies (<7keV) of High Pressure X-Ray Absorption Spectroscopy" Paper presented at the Ninth International Conference on ...

... Itié, J.P., Flank, A.M., Lagarde, P., Pellicer-Porres, J., Sans, J.A., Sanchez-Royo, J.F., Segura, A., Polian, A., Britt Hedman &Piero Pianetta "High Pressure X-ray Absorption Spectroscopy on Zn1-xMnxO (x=0.25 and x=0.05) at the Mn K Edge" Paper presented ...

... Itié, J.P., Couzinet, B., Polian, A., Flank, A.M., Lagarde, P. "Pressure-induced disappearance of the local rhombohedral distortion in BaTiO3" Europhysics Letters., 74(4): 706-711. (2006). ...

... Itié, J.P., Couzinet, B., Flank, A.M., Lagarde, P., Polian, A., Britt Hedman &Piero Pianetta "High Pressure XAS at the Ti K Edge on Titanate Perovskites" Paper presented at the 13th International Conference on X-Ray Absorption Fine Structure - XAFS13 - 9 ...

... Itié, J.P., Couzinet, B., Dhaussy, A.C., Flank, A.M., Jaouen, N., Lagarde, P., Polian, A. "X-ray absorption spectroscopy on titanate perovskites at the TiK edge" High Pressure Research., 26(4): 325-330. (2006). ...

... Idir, M., Mercère, P., Moreno, T., Delmotte, A., Jae-Young Choi & Seungyu Rah "Metrology and Tests Beamline at SOLEIL" Paper presented at the Ninth International Conference on Synchrotron Radiation Instrumentation 28 May-2 June 2006. Jae-Young Choi & ...

... Idir, M., Mercère, P., Moreno, T., Delmotte, A. "Metrology and test beamline at SOLEIL" Synchrotron Radiation News., 19(4): 18-23. (2006). ...

... Idir, M., Brochet, S., Delmotte, A., Lagarde, B., Mercère, P., Moreno, T., Polack, F., Thomasset, M. "Le pôle de métrologie de SOLEIL." Journal de Physique IV., 138: 265-274. (2006). ...

... Hecquet, C., Roulliay, M., Delmotte, F., Ravet-Krill, M. F., Hardouin, A., Idir, M., Zeitoun, P. "EUV large spectrum reflectometry for the metrology of optics" Journal de physique IV., 138: 259-264. (2006). ...