RECHERCHER

... Belkhou, R., Stanescu, S., Swaraj, S., Besson, A., Ledoux, M., Hajlaoui, M., Dalle, D. "HERMES: a soft X-ray beamline dedicated to X-ray microscopy" Journal of Synchrotron Radiation., 22(4): 968-979. (2015). ...

... Barbier, A., Aghavnian, T., Badjeck, V., Mocuta, C., Stanescu, D., Magnan, H., Rountree, C.L., Belkhou, R., Ohresser, P., Jedrecy, N. "Antiferromagnetic long-range spin ordering in Fe- and NiFe2-doped BaTiO3 multiferroic layers" Physical Review B., 91(3): ...

... Mercère, P. "Métrologie à SOLEIL : optique en rayons X" Photoniques., 72: 39-41. (2014). ...

... Mandal, S., Belkhou, R., Maccherozzi, F., Menon, K.S.R. "Magnetic skin layer of NiO(100) probed by polarization-dependent spectromicroscopy" Applied Physics Letters., 104(24): art.n° 242414. (2014). ...

... Gogneau, N., Ben Gouider Trabelsi, A., Silly, M.G., Ridene, M., Portail, M., Michon, A., Oueslati, M., Belkhou, R., Sirotti, F., Ouerghi, A. "Investigation of structural and electronic properties of epitaxial graphene on 3C–SiC(100)/Si(100) substrates" ...

... Emprin, B., Troussel, P., Soullié, G., Stemmler, P., Mercère, P., Meltchakov, E., Jérôme, A., Delmotte, F. "Characterization of subnanometric layers by grazing incidence X-ray reflectometry" Thin Solid Films., 556: 54–60. (2014). ...

... Emprin, B., Troussel, P., Soullie, G., Stemmler, P., Mercere, P., Meltchakov, E., Jerome, A., Delmotte, F. "X-ray broadband Ni/SiC multilayers: improvement with W barrier layers" Optics Express., 22(21): 25853-25865. (2014). ...

... Desjardins, K., Bordessoule, M., Petrache, C., Menneglier, C., Dallé, D., Mercere, P., Medjoubi, K. "MTF, NPS and DQE characterization of an in-house developed X-ray imaging detector for synchrotron based micro-tomography" Journal of Instrumentation., 9: ...

... Velez-Fort, E., Mathieu, C., Pallecchi, E., Pigneur, M., Silly, M.G., Belkhou, R., Marangolo, M., Shukla, A., Sirotti, F., Ouerghi, A. "Epitaxial Graphene on 4H-SiC(0001) Grown under Nitrogen Flux: Evidence of Low Nitrogen-Doping and High Charge transfer" ...

... Reverdin, C., Thais, F., Loisel, G., Busquet, M., Bastiani-Ceccotti, S., Blenski, T., Caillaud, T., Ducret, J.E., Foelsner, W., Gilles, D., Gilleron, F., Pain, J.C., Poirier, M., Serres, F., Silvert, V., Soullie, G., Turck-Chieze, S., Villette, B. "X-ray ...