RECHERCHER

... Idir, M., Dovillaire, G., Mercere, P. "Ex- and In-situ Metrology Based on the Shack-Hartmann Technique for Sub-nanometric Metrology" Synchrotron Radiation News., 26(5): 23-29. (2013). ...

... Emprin, B., Troussel, P., Villette, B., Delmotte, F., Proceedings of SPIE "Spectral filtering optimization of a measuring channel of an X-ray broadband spectrometer" Paper presented at the Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: ...

... Choueikani, F., Delmotte, F., Bridou, F., Lagarde, B., Mercere, P., Otero, E., Ohresser, P., Polack, F. "Preparation for B4C/Mo2C multilayer deposition of alternate multilayer gratings with high efficiency in the 0.5-2.5 keV energy range" Journal of ...

... Choueikani, F., Bridou, F., Lagarde, B., Meltchakov, E., Polack, F., Mercere, P., Delmotte, F. "X-ray properties and interface study of B4C/Mo and B4C/Mo2C periodic multilayers" Applied Physics A: Materials Science & Processing., 111(1): 191-198. (2013). ...

... Choueikani, F., Lagarde, B., Delmotte, F., Krumrey, M., Bridou, F., Thomasset, M., Meltchakov, E., Polack, F. "High-efficiency B4C/Mo2C alternate multilayer grating for monochromators in the photon energy range from 0.7 to 3.4 keV" Optics Letters., 39(7): ...

... Chiuzbaian, S. G., Hague, C.F., Avila, A., Delaunay, R., Jaouen, N., Sacchi, M., Polack, F., Thomasset, M., Lagarde, B., Nicolaou, A., Brignolo, S., Baumier, C., Lüning, J., Mariot, J.M. "Design and performance of AERHA, a high acceptance high resolution ...

... Buton, C., Dawiec, A., Graber-Bolis, J., Arnaud, K., Bérar, J.F., Blanc, N., Boudet, N., Clémens, J.C., Debarbieux, F., Delpierre, P., Dinkespiler, B., Gastaldi, T., Hustache, S., Pangaud, P., Perez-Ponce, H., Vigeolas, E. "Comparison of three types of ...

... Belkhou, R., Cinquin, B., Jamme, F., Jaouen, N., Medjoubi, K., Quinkal, I., Vantelon, D., Refregiers, M. "Microscopies synchrotron à SOLEIL" Photoniques., 72: 30-33. (2014). ...

... Velez-Fort, E., Silly, M.G., Belkhou, R., Shukla, A., Sirotti, F., Ouerghi, A. "Edge state in epitaxial nanographene on 3C-SiC(100)/Si(100) substrate" Applied Physics Letters., 103(8): art.n° 083101. (2013). ...

... Valleau, M., Benabderrahmane, C., Chubar, O., Marteau, F., Belkhou, R., Miron, C., Rueff, J.P., Couprie, M.E. "Comparison between measured and simulated X-ray flux from different undulators at SOLEIL" Journal of Physics Conferences Series., 425: art.n° ...