RECHERCHER

... Vescovo, E., Mentes, T.O., Sadowski, J.T., Ablett, J.M., Niño, M.A., Locatelli, A. "Domain faceting in an in-plane magnetic reorientation transition" Physical Review B., 82(18): art.n° 184405. (2010). ...

... Rueff, J.P., Shukla, A. "Inelastic x-ray scattering by electronic excitations under high pressure" Reviews of Modern Physics., 82(1): 847–896. (2010). ...

... Rueff, J.P., Eric Beaurepaire, Hervé Bulou, Fabrice Scheurer and Kappler Jean-Paul "An Introduction to Inelastic X-Ray Scattering" In Magnetism and Synchrotron Radiation: 263-277: Springer, 2010. ISBN: 978-3-642-04497-7 ...

... Rodolakis, F., Hansmann, P., Rueff, J.P., Toschi, A., Haverkort, M.W., Sangiovanni, G., Tanaka, A., Saha-Dasgupta, T., Andersen, O.K., Held, K., Sikora, M., Alliot, I., Itié, J.P., Baudelet, F., Wzietek, P., Metcalf, P., Marsi, M. "Inequivalent Routes ...

... Martin, R.R., Schotyk, W.S., Naftel, S.J., Ablett, J.M., Northrup, P. "Speciation of antimony in polyethylene terephthalate bottles" X-ray Spectrometry., 39(4): 257–259. (2010). ...

... Lupi, S., Baldassarre, L., Mansart, B., Perucchi, A., Barinov, A., Dudin, P., Papalazarou, E., Rodolakis, F., Rueff, J.P., Itié, J.P., Ravy, S., Nicoletti, D., Postorino, P., Hansmann, P., Parragh, N., Toschi, A., Saha-Dasgupta, T., Andersen, O. K., ...

... Heathman, S., Rueff, J.P., Simonelli, L., Denecke, M.A., Griveau, J.C., Caciuffo, R., Lander, G.H. "Resonant x-ray emission spectroscopy at the L3 edge of americium up to 23 GPa" Physical Review B., 82(20): art.n° 201103. (2010). ...

... Gougoussis, C., Rueff, J.P., Calandra, M., d’Astuto, M., Jarrige, I, Ishii, H., Shukla, A., Yamada, I., Azuma, M., Takano, M. "Multiple pre-edge structures in Cu K-edge x-ray absorption spectra of high-Tc cuprates revealed by high-resolution x-ray ...

... Beauchemin, S., Fiset, J.F., Poirier, G., Ablett, J.M. "Arsenic in an Alkaline AMD Treatment Sludge: Characterization and Stability Under Prolonged Anoxic Conditions" Applied Geochemistry., 25(10): 1487-1499. (2010). ...

... Ablett, J.M., Woicik, J.C., Tokei, Z., List, S., Dimasi, E. "Phase identification of self-forming Cu–Mn based diffusion barriers on p-SiOC:H and SiO2 dielectrics using x-ray absorption fine structure" Applied Physics Letters., 94(4): art.n° 042112. (2009 ...