RECHERCHER

... El Kazzi, M., Merckling, C., Saint-Girons, G., Grenet, G., Silly, M.G., Sirotti, F., Hollinger, G. "High oxidation state at the epitaxial interface of y-Al2O3 thin films grown on Si(111) and Si(001)" Applied Physics Letters., 97(15): art.n° 151902. (2010 ...

... Bergeard, N., Jamet, J.P., Ferré, J., Mougin, A., Fassbender, J. "Spin reorientation transition and phase diagram in an He+ ion irradiated ultrathin Pt/Co(0.5 nm)/Pt film" Journal of Applied Physics., 108(10): art.n° 103915. (2010). ...

... Beauchemin, S., Fiset, J.F., Poirier, G., Ablett, J.M. "Arsenic in an Alkaline AMD Treatment Sludge: Characterization and Stability Under Prolonged Anoxic Conditions" Applied Geochemistry., 25(10): 1487-1499. (2010). ...

... Barrett, N., Rault, J., Krug, I., Vilquin, B., Niu, G., Gautier, B., Albertini, D., Lecoeur, P., Renault, O. "Influence of the ferroelectric polarization on the electronic structure of BaTiO3 thin films" Surface and Interface Analysis., 42(12-13): 1690 ...

... Akhtar, J., Malik, A., O'Brien, P., Wijayantha, K.G.U., Dharmadasa, R., Hardman, S.J.O., Graham, D.M., Spencer, B.F., Stubbs, S.K., Flavell, W.R., Binks, D.J., Sirotti, F., El Kazzi, M., Silly, M.G. "A greener route to photoelectrochemically active PbS ...

... Ablett, J.M., Woicik, J.C., Tokei, Z., List, S., Dimasi, E. "Phase identification of self-forming Cu–Mn based diffusion barriers on p-SiOC:H and SiO2 dielectrics using x-ray absorption fine structure" Applied Physics Letters., 94(4): art.n° 042112. (2009 ...

... Rueff, J.P., Mezouar, M., Acet, M. "Short-range magnetic collapse of Fe under high pressure at high temperatures observed using x-ray emission spectroscopy" Physical Review B., 78(10): art.n° 100405. (2008). ...

... Jarrige, I, Rueff, J.P., Shieh, S. R., Taguchi, M., Ohishi, Y., Matsumura, T., Wang, C.P., Ishii, H., Hiraoka, N., Cai, Y.Q. "Pressure-Induced Valence Anomaly in TmTe Probed by Resonant Inelastic X-Ray Scattering" Physical Review Letters., 101(12): art.n ...

... Hague, C.F., Mariot, J.-M., Ilakovac, V., Delaunay, R., Marsi, M., Sacchi, M., Rueff, J.P., Felsch, W. "Charge transfer at the metal-insulator transition in V2O3 thin films by resonant inelastic x-ray scattering" Physical Review B., 77(4): art.n° 045132. ...

... Bowerman, B., Ablett, J.M., Milian, L., Adams, J., Ludwig, H., Todosow, M. "An infiltration manufacturing process for nuclear fuels". Paper presented at the 4th International Topical Meeting on High Temperature Reactor Technology, HTR 2008 -28/09-01/10 ...