RECHERCHER

... Hague, C.F., Mariot, J.-M., Ilakovac, V., Delaunay, R., Marsi, M., Sacchi, M., Rueff, J.P., Felsch, W. "Charge transfer at the metal-insulator transition in V2O3 thin films by resonant inelastic x-ray scattering" Physical Review B., 77(4): art.n° 045132. ...

... Gautier, J., Zeitoun, P., Hauri, C., Morlens, A.S., Rey, G., Valentin, C., Papalarazou, E., Goddet, J.P., Sebban, S., Burgy, F., Mercère, P., Idir, M., Dovillaire, G., Levecq, X., Bucourt, S., Fajardo, M., Merdji, H., Caumes, J.P. "Optimization of the ...

... Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Polack, F., Idir, M., Mercère, P., Moreno, T., Brochet, S. "A Shack-Hartmann measuring head for the two-dimensional characterization of X-ray mirrors" Journal of Synchrotron Radiation., 15(2): 134-139. ...

... Couprie, M. E., Loulergue, A., Benabderrahmane, C., Chubar, O., Denard, J. C., Filhol, J.M., Idir, M., Labat, M., Lestrade, A., Louvet, M., Marchand, P., Marcouillé, O., Mercère, P., Nadolski, L., Nahon, L., Dumas, P., Morin, P., Bruni, C., Lambert, G., ...

... Bowerman, B., Ablett, J.M., Milian, L., Adams, J., Ludwig, H., Todosow, M. "An infiltration manufacturing process for nuclear fuels". Paper presented at the 4th International Topical Meeting on High Temperature Reactor Technology, HTR 2008 -28/09-01/10 ...

... Abbamonte, P., Graber, T., Reed, J.P., Smadici, S., Yeh, C.L., Shukla, A., Rueff, J.P., Ku, W. "Dynamical reconstruction of the exciton in LiF with inelastic x-ray scattering" PNAS., 105(34): 12159-12163. (2008). ...

... Rueff, J.P., Raymond, S., Yaresko, A., Braithwaite, D., Leininger, P., Vankó, G., Huxley, A., Rebizant, J., Sato, N. "Pressure-induced f-electron delocalization in the U-based strongly correlated compounds UPd3 and UPd2Al3: Resonant inelastic x-ray ...

... Rueff, J.P., Hague, C.F., Itié, J.P., Mariot, J.M., Raymond, S., Taguchi, M., Yaresko, A. "Localization-delocalization of f-electron: A novel view by resonant inelastic X-ray scattering under high pressure". Paper presented at the . JOURNAL OF ELECTRON ...

... Reverchon, J.L., Robo, J.A., Truffer, J.P., Caumes, J.P., Idir, M., Brault, J., Duboz, J.Y. "AlGaN-based focal plane arrays for selective UV imaging at 310nm and 280nm and route toward deep UV imaging". Paper presented at the Sensors, Systems, and Next ...

... Ryan, C.G., Siddons, D.P., Moorhead, G., Kirkham, R., De Geronimo, G., Etschmann, B.E., Dragone, A., Dunn, P.A., Kuczewski, A., Davey, P., Jensen, M., Ablett, J.M., Kuczewski, J., Hough, R., Paterson, D. "High-throughput X-ray fluorescence imaging using a ...